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Property	Value
rdfs:subClassOf	yago:SemiconductorDevice104171831
owl:equivalentClass	yago-res:wikicat_Semiconductor_devices
is rdf:type of	dbr:Electron_beam-induced_current dbr:Semiconductor_memory dbr:MESFET dbr:MOS_composite_static_induction_thyristor dbr:Metal_rectifier dbr:Resistive_opto-isolator dbr:Charge-coupled_device dbr:Charge-induced_voltage_alteration dbr:Current-feedback_operational_amplifier dbr:DIAC dbr:Doping_(semiconductor) dbr:EOSFET dbr:Insulated-gate_bipolar_transistor dbr:Integrated_gate-commutated_thyristor dbr:Interband_cascade_laser dbr:JFET dbr:Opto-isolator dbr:Power_semiconductor_device dbr:Proper_zero-signal_collector_current dbr:Gate_array dbr:Gate_turn-off_thyristor dbr:Shockley–Queisser_limit dbr:P–n_diode dbr:P–n_junction dbr:Contact_image_sensor dbr:LED_lamp dbr:Oscillistor dbr:MOSFET dbr:Haitz's_law dbr:Hall_effect_sensor dbr:Hot-carrier_injection dbr:Photodiode dbr:Planar_process dbr:Position_sensitive_device dbr:Transient-voltage-suppression_diode dbr:Micromirror_device dbr:Vertical-cavity_surface-emitting_laser dbr:78xx dbr:Tunnel_diode dbr:Darlington_transistor dbr:Ion_implantation dbr:Laser-assisted_device_alteration dbr:Laser_diode dbr:Load_line_(electronics) dbr:Polysilicon_depletion_effect dbr:Shockley_diode dbr:Dip-coating dbr:Foveon_X3_sensor dbr:Semiconductor_device_fabrication dbr:Active_pixel_sensor dbr:Wafer_bonding dbr:Bipolar_junction_transistor dbr:Zener_diode dbr:Digital_micromirror_device dbr:Avalanche_diode dbr:Field-programmable_gate_array dbr:MOS-controlled_thyristor dbr:Silicon_controlled_rectifier dbr:Solid-state_lighting dbr:Static_induction_thyristor dbr:Static_induction_transistor dbr:Schottky_diode dbr:Application-specific_standard_product dbr:Gunn_diode dbr:ISFET dbr:Unijunction_transistor dbr:Plasma_etcher dbr:Multi-junction_solar_cell dbr:Piezotronics dbr:Trisil dbr:Varicap dbr:Stabistor dbr:Oxide_thin-film_transistor dbr:Thyristor dbr:Spin_coating