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Charge-induced voltage alteration (CIVA) is a technique which uses a scanning electron microscope to locate open conductors on CMOS integrated circuits. This technique is used in semiconductor failure analysis.

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  • Charge-induced voltage alteration (CIVA) is a technique which uses a scanning electron microscope to locate open conductors on CMOS integrated circuits. This technique is used in semiconductor failure analysis. (en)
  • L'alterazione della tensione indotta da cariche (CIVA) è una tecnica di analisi e ricerca di difetti e guasti usata nella produzione di circuiti integrati a semiconduttore in tecnologia CMOS. (it)
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  • Charge-induced voltage alteration (CIVA) is a technique which uses a scanning electron microscope to locate open conductors on CMOS integrated circuits. This technique is used in semiconductor failure analysis. (en)
  • L'alterazione della tensione indotta da cariche (CIVA) è una tecnica di analisi e ricerca di difetti e guasti usata nella produzione di circuiti integrati a semiconduttore in tecnologia CMOS. (it)
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  • Charge-induced voltage alteration (en)
  • Alterazione della tensione indotta da cariche (it)
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