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Semiconductor characterization techniques are used to characterize a semiconductor material or device (PN junction, Schottky diode, etc.). Some examples of semiconductor properties that could be characterized include the depletion width, carrier concentration, carrier generation and recombination rates, carrier lifetimes, defect concentration, and trap states.

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  • Semiconductor characterization techniques are used to characterize a semiconductor material or device (PN junction, Schottky diode, etc.). Some examples of semiconductor properties that could be characterized include the depletion width, carrier concentration, carrier generation and recombination rates, carrier lifetimes, defect concentration, and trap states. (en)
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  • Semiconductor characterization techniques are used to characterize a semiconductor material or device (PN junction, Schottky diode, etc.). Some examples of semiconductor properties that could be characterized include the depletion width, carrier concentration, carrier generation and recombination rates, carrier lifetimes, defect concentration, and trap states. (en)
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  • Semiconductor characterization techniques (en)
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