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About:
Semiconductor characterization techniques
An Entity of Type:
Thing
,
from Named Graph:
http://dbpedia.org
,
within Data Space:
dbpedia.org
Experimental techniques to characterize semiconductor devices and materials
Property
Value
dbo:
description
experimental techniques to characterize semiconductor devices and materials
(en)
dbo:
wikiPageWikiLink
dbr
:Raman_spectroscopy
dbc
:Semiconductor_analysis
dbr
:Power_electronics
dbr
:Ion_beam
dbr
:Hall_effect
dbr
:Semiconductor_device
dbr
:X-ray
dbr
:Photoluminescence
dbr
:Absorption_spectroscopy
dbr
:Contact_resistance
dbr
:Electron_energy_loss_spectroscopy
dbr
:Ellipsometry
dbr
:Sputtering
dbr
:X-ray_fluorescence
dbr
:X-ray_photoelectron_spectroscopy
dbr
:Silicon
dbr
:Photovoltaics
dbr
:Microscopy
dbr
:Neutron_activation_analysis
dbr
:Carrier_lifetime
dbr
:Computing
dbr
:Secondary_ion_mass_spectrometry
dbr
:Deep-level_transient_spectroscopy
dbr
:Schottky_diode
dbr
:Chemical_milling
dbr
:Electron_beam-induced_current
dbr
:Reflectance
dbr
:Electron_microprobe
dbr
:Carrier_generation_and_recombination
dbr
:Four-terminal_sensing
dbr
:Auger_electron_spectroscopy
dbr
:Light-emitting_diode
dbr
:Cathodoluminescence
dbr
:Rutherford_backscattering_spectrometry
dbr
:Characterization_(materials_science)
dbr
:Drive-level_capacitance_profiling
dbr
:X-ray_diffraction
dbr
:Transmission_Electron_Microscopy
dbr
:Capacitance_voltage_profiling
dbr
:Organic_semiconductors
dbr
:Electron_beam
dbr
:PN_junction
dbr
:Depletion_width
dbr
:Carrier_concentration
dbr
:Resistivity
dbr
:Scanning_Electron_Microscopy
dbr
:Semiconductor_material
dbp:
wikiPageUsesTemplate
dbt
:Use_American_English
dbt
:Use_mdy_dates
dbt
:Short_description
dct:
subject
dbc
:Semiconductor_analysis
rdfs:
label
Semiconductor characterization techniques
(en)
owl:
sameAs
freebase
:Semiconductor characterization techniques
wikidata
:Semiconductor characterization techniques
dbpedia-global
:Semiconductor characterization techniques
prov:
wasDerivedFrom
wikipedia-en
:Semiconductor_characterization_techniques?oldid=1246679471&ns=0
foaf:
isPrimaryTopicOf
wikipedia-en
:Semiconductor_characterization_techniques
is
dbo:
wikiPageRedirects
of
dbr
:Semiconductor_Device_Characterization_Techniques
is
dbo:
wikiPageWikiLink
of
dbr
:Semiconductor
dbr
:Index_of_physics_articles_(S)
dbr
:List_of_semiconductor_materials
dbr
:Characterization_(materials_science)
dbr
:Semiconductor_Device_Characterization_Techniques
is
foaf:
primaryTopic
of
wikipedia-en
:Semiconductor_characterization_techniques
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