About: Deep-level transient spectroscopy

Property	Value
dbo:description	експериментальний метод дослідження електрично активних дефектів у напівпровідниках (uk) experimental tool for studying electrically active defects in semiconductors (en) méthode expérimentale d'investigation des défauts profonds électriquement actifs dans les semiconducteurs (fr)
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dbo:wikiPageExternalLink	http://www.kc.tsukuba.ac.jp/div-media/defect/index.php http://www.laplacedlts.eu/LaplaceIFPAN_2defects.htm
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dbp:date	2011-07-17 (xsd:date)
dbp:url	https://web.archive.org/web/20110717125631/http:/www.kc.tsukuba.ac.jp/div-media/defect/index.php
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dct:subject	dbc:Semiconductor_analysis dbc:Spectroscopy
gold:hypernym	dbr:Tool
rdfs:label	Deep-level transient spectroscopy (en) DLTS (ja) Spettroscopia dei transitori di livello profondo (it) Spektroskopia poziomów energetycznych defektów (pl)
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