About: Wafer testing

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Step performed during semiconductor device fabrication by applying special test patterns to a wafer before it is sent to die preparation

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  • 半導體製程步驟之一 (zh)
  • és un test que es realitza durant la fabricació de dispositius semiconductors un cop finalitzat el procés BEOL (ca)
  • step performed during semiconductor device fabrication by applying special test patterns to a wafer before it is sent to die preparation (en)
  • مرحله‌ای که درطول برساخت افزاره نیم‌رسانا با اعمال الگوهای آزمایشی خاص روی ویفر قبل از ارسال به آمایش دای انجام می‌شود. (fa)
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  • Wafer testing (en)
  • Assaig d'oblies (ca)
  • Wafertest (de)
  • Тестирование полупроводниковых пластин (ru)
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