About: Non-contact wafer testing

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Prova final de fabricació d'oblies

Property	Value
dbo:description	prova final de fabricació d'oblies (ca) prova final de fabricació d'oblies (ca)
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dbo:wikiPageWikiLink	dbr:Debris dbr:Redox dbr:Wafer_(electronics) dbr:Spring_(device) dbr:Aluminium dbr:Wireless dbr:Data_signaling_rate dbr:Semiconductor_device_fabrication dbr:Cantilever dbc:Semiconductor_device_fabrication dbr:Automatic_test_equipment dbr:Transmitter dbc:Cleanroom_technology dbr:Contamination dbr:Radio_frequency dbr:RFID dbr:Packaging_and_labeling dbr:Microelectromechanical_systems dbr:Integrated_circuits dbr:IC_packaging
dbp:wikiPageUsesTemplate	dbt:Reflist dbt:More_citations_needed
dct:subject	dbc:Semiconductor_device_fabrication dbc:Cleanroom_technology
gold:hypernym	dbr:Step
rdfs:label	Non-contact wafer testing (en)
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foaf:isPrimaryTopicOf	wikipedia-en:Non-contact_wafer_testing
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is foaf:primaryTopic of	wikipedia-en:Non-contact_wafer_testing

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