About: Capacitance–voltage profiling

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Technique for characterizing semiconductor materials and devices

Property	Value
dbo:description	technique for characterizing semiconductor materials and devices (en) تهیۀ یا ترسیم رُخ‌نمایی از تغییرات ظرفیت خازنی برحسب ولتاژ در افزاره‌های نیم‌رسانا (fa)
dbo:thumbnail	wiki-commons:Special:FilePath/Illustration_of_C-V_measurement.gif?width=300
dbo:wikiPageExternalLink	http://nanohub.org/resources/moscap
dbo:wikiPageWikiLink	dbr:Electron dbr:Current–voltage_characteristic dbr:Fermi_level dbr:Schottky_barrier dbr:Metal dbr:Semiconductor dbr:Voltage dbr:Capacitance dbr:Electron_hole dbr:MOSFET dbr:Deep-level_transient_spectroscopy dbr:P–n_junction dbc:Semiconductor_device_fabrication dbr:NanoHUB dbr:Carrier_generation_and_recombination dbr:Depletion_region dbr:Channel_(semiconductor) dbr:Valence_band dbr:Metal–oxide–semiconductor_structure dbr:File:Illustration_of_C-V_measurement.gif dbr:Depletion_width dbr:Drive_Level_Capacitance_Profiling dbr:Potential_barrier dbr:Semiconductor_material
dbp:wikiPageUsesTemplate	dbt:Reflist dbt:Short_description
dct:subject	dbc:Semiconductor_device_fabrication
gold:hypernym	dbr:Technique
rdfs:label	Capacitance–voltage profiling (en) C-V特性曲线 (zh)
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