About: Semiconductor device defects

An Entity of Type: Concept, from Named Graph: http://dbpedia.org, within Data Space: dbpedia.org

Property	Value
dbo:wikiPageID	26723817 (xsd:integer)
dbo:wikiPageRevisionID	758624166 (xsd:integer)
rdf:type	skos:Concept
rdfs:label	Semiconductor device defects (en)
skos:broader	dbc:Technological_failures dbc:Semiconductor_devices
skos:prefLabel	Semiconductor device defects (en)
prov:wasDerivedFrom	wikipedia-en:Category:Semiconductor_device_defects?oldid=758624166&ns=14
is dbo:wikiPageWikiLink of	dbr:Electromigration dbr:Negative-bias_temperature_instability dbr:List_of_LED_failure_modes dbr:Current_crowding dbr:Current_filament dbr:Conductive_anodic_filament dbr:Feedback-controlled_electromigration dbr:Hot-carrier_injection dbr:Time-dependent_gate_oxide_breakdown dbr:Head_crash dbr:Latch-up dbr:Failure_of_electronic_components dbr:QBD_(electronics) dbr:Catastrophic_optical_damage dbr:Stress-induced_leakage_current dbr:Thermal_runaway dbr:Radiation_hardening dbr:Transistor_aging
is dct:subject of	dbr:Electromigration dbr:Negative-bias_temperature_instability dbr:List_of_LED_failure_modes dbr:Current_crowding dbr:Current_filament dbr:Conductive_anodic_filament dbr:Feedback-controlled_electromigration dbr:Hot-carrier_injection dbr:Time-dependent_gate_oxide_breakdown dbr:Head_crash dbr:Latch-up dbr:Failure_of_electronic_components dbr:QBD_(electronics) dbr:Catastrophic_optical_damage dbr:Stress-induced_leakage_current dbr:Thermal_runaway dbr:Radiation_hardening dbr:Transistor_aging

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