About: Test compression

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Integrated circuit testing technique

Property	Value
dbo:description	Integrated circuit testing technique (en)
dbo:wikiPageExternalLink	http://www.c-eda.org/index.php%3Fmenuphp=menu_dss&mainpage=rajski-abs
dbo:wikiPageWikiLink	dbc:Electronic_design dbc:Electronic_design_automation dbr:Integrated_circuit_design dbr:Automatic_test_pattern_generation dbr:Electronic_design_automation dbc:Integrated_circuits dbc:Electronic_engineering dbr:Integrated_circuit dbr:IEEE_Council_on_Electronic_Design_Automation dbr:IEEE dbr:Design_For_Test dbr:Design_for_test
dbp:wikiPageUsesTemplate	dbt:Reflist dbt:Short_description
dct:subject	dbc:Electronic_design dbc:Electronic_design_automation dbc:Integrated_circuits dbc:Electronic_engineering
gold:hypernym	dbr:Technique
rdfs:label	Test compression (en)
owl:sameAs	freebase:Test compression wikidata:Test compression dbpedia-global:Test compression yago-res:Test compression
prov:wasDerivedFrom	wikipedia-en:Test_compression?oldid=1280913519&ns=0
foaf:isPrimaryTopicOf	wikipedia-en:Test_compression
is dbo:wikiPageWikiLink of	dbr:Scan_chain dbr:Design_for_testing
is foaf:primaryTopic of	wikipedia-en:Test_compression

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