About: Scan chain

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Type of manufacturing test used with integrated circuits

Property	Value
dbo:description	tipus de prova de fabricació utilitzat amb circuits integrats (ca) type of manufacturing test used with integrated circuits (en)
dbo:thumbnail	wiki-commons:Special:FilePath/Scan_Chain.jpg?width=300
dbo:wikiPageExternalLink	https://web.archive.org/web/20150226004313/http:/people.ee.duke.edu/~krish/teaching/ECE269/how_does_scan_work.pdf
dbo:wikiPageWikiLink	dbr:Shift_register dbc:Electronic_circuit_verification dbr:Observability dbr:Combinational_logic dbr:Controllability dbr:Integrated_circuit_design dbr:Automatic_test_pattern_generation dbr:Electronic_design_automation dbr:Integrated_circuit dbr:Clock_signal dbr:Test_compression dbr:Flip-flop_(electronics) dbr:Design_for_testing dbr:Iddq_testing dbr:Sequential_circuit dbr:Serial_Peripheral_Interface_Bus
dct:subject	dbc:Electronic_circuit_verification
gold:hypernym	dbr:Technique
rdfs:label	Scan chain (en) Scan Test (de) 扫描链 (zh)
owl:sameAs	freebase:Scan chain wikidata:Scan chain dbpedia-de:Scan chain dbpedia-tr:Scan chain dbpedia-zh:Scan chain dbpedia-global:Scan chain
prov:wasDerivedFrom	wikipedia-en:Scan_chain?oldid=1295149820&ns=0
foaf:depiction	wiki-commons:Special:FilePath/Scan_Chain.jpg
foaf:isPrimaryTopicOf	wikipedia-en:Scan_chain
is dbo:wikiPageDisambiguates of	dbr:Scan
is dbo:wikiPageRedirects of	dbr:Partial_scan dbr:Scan_design
is dbo:wikiPageWikiLink of	dbr:Boundary_scan dbr:Automatic_test_pattern_generation dbr:Semiconductor_device_fabrication dbr:Scan dbr:Hardware_Trojan dbr:Design_for_testing dbr:Iddq_testing dbr:High-temperature_operating_life dbr:Partial_scan dbr:Scan_design
is foaf:primaryTopic of	wikipedia-en:Scan_chain

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