dbo:abstract
|
- In electronics, short-channel effects occur in MOSFETs in which the channel length is comparable to the depletion layer widths of the source and drain junctions. These effects include, in particular, drain-induced barrier lowering, velocity saturation, quantum confinement and hot carrier degradation. (en)
- 電子工学において短チャネル効果は、チャネル長がソースとドレインの接合の空乏層幅に相当するMOSFETで起こる。短チャネル効果には、ドレイン誘起障壁低下、、などがある。 (ja)
- Em eletrônica, efeito de canal curto ocorre em transistores MOSFETs quando o tamanho do tem dimensões comparáveis a região de depleção do terminal Fonte e Dreno. Esse efeito implica particularmente na , , e . (pt)
- 短沟道效应(英語:short-channel effects)是当金属氧化物半导体场效应管的导电沟道长度降低到十几纳米、甚至几纳米量级时,晶体管出现的一些效应。这些效应主要包括阈值电压随着沟道长度降低而降低、、载流子表面散射、、离子化和热电子效应。 (zh)
|
dbo:wikiPageID
| |
dbo:wikiPageLength
|
- 883 (xsd:nonNegativeInteger)
|
dbo:wikiPageRevisionID
| |
dbo:wikiPageWikiLink
| |
dbp:wikiPageUsesTemplate
| |
dcterms:subject
| |
gold:hypernym
| |
rdf:type
| |
rdfs:comment
|
- In electronics, short-channel effects occur in MOSFETs in which the channel length is comparable to the depletion layer widths of the source and drain junctions. These effects include, in particular, drain-induced barrier lowering, velocity saturation, quantum confinement and hot carrier degradation. (en)
- 電子工学において短チャネル効果は、チャネル長がソースとドレインの接合の空乏層幅に相当するMOSFETで起こる。短チャネル効果には、ドレイン誘起障壁低下、、などがある。 (ja)
- Em eletrônica, efeito de canal curto ocorre em transistores MOSFETs quando o tamanho do tem dimensões comparáveis a região de depleção do terminal Fonte e Dreno. Esse efeito implica particularmente na , , e . (pt)
- 短沟道效应(英語:short-channel effects)是当金属氧化物半导体场效应管的导电沟道长度降低到十几纳米、甚至几纳米量级时,晶体管出现的一些效应。这些效应主要包括阈值电压随着沟道长度降低而降低、、载流子表面散射、、离子化和热电子效应。 (zh)
|
rdfs:label
|
- 短チャネル効果 (ja)
- Short-channel effect (en)
- Efeito de canal curto (pt)
- 短沟道效应 (zh)
|
owl:sameAs
| |
prov:wasDerivedFrom
| |
foaf:isPrimaryTopicOf
| |
is dbo:wikiPageDisambiguates
of | |
is dbo:wikiPageRedirects
of | |
is dbo:wikiPageWikiLink
of | |
is foaf:primaryTopic
of | |