This HTML5 document contains 118 embedded RDF statements represented using HTML+Microdata notation.

The embedded RDF content will be recognized by any processor of HTML5 Microdata.

Namespace Prefixes

PrefixIRI
dbpedia-dehttp://de.dbpedia.org/resource/
n20http://shrimp.anu.edu.au/
dctermshttp://purl.org/dc/terms/
dbohttp://dbpedia.org/ontology/
foafhttp://xmlns.com/foaf/0.1/
n21http://www.asi-pl.com/
n9http://dbpedia.org/resource/File:
n16https://global.dbpedia.org/id/
dbthttp://dbpedia.org/resource/Template:
rdfshttp://www.w3.org/2000/01/rdf-schema#
freebasehttp://rdf.freebase.com/ns/
n14http://commons.wikimedia.org/wiki/Special:FilePath/
rdfhttp://www.w3.org/1999/02/22-rdf-syntax-ns#
owlhttp://www.w3.org/2002/07/owl#
wikipedia-enhttp://en.wikipedia.org/wiki/
dbphttp://dbpedia.org/property/
dbchttp://dbpedia.org/resource/Category:
provhttp://www.w3.org/ns/prov#
xsdhhttp://www.w3.org/2001/XMLSchema#
goldhttp://purl.org/linguistics/gold/
wikidatahttp://www.wikidata.org/entity/
dbrhttp://dbpedia.org/resource/
dbpedia-jahttp://ja.dbpedia.org/resource/

Statements

Subject Item
dbr:Roberta_Rudnick
dbo:wikiPageWikiLink
dbr:Sensitive_high-resolution_ion_microprobe
Subject Item
dbr:Detrital_zircon_geochronology
dbo:wikiPageWikiLink
dbr:Sensitive_high-resolution_ion_microprobe
Subject Item
dbr:John_Robert_de_Laeter
dbo:wikiPageWikiLink
dbr:Sensitive_high-resolution_ion_microprobe
Subject Item
dbr:List_of_mass_spectrometry_acronyms
dbo:wikiPageWikiLink
dbr:Sensitive_high-resolution_ion_microprobe
Subject Item
dbr:List_of_plasma_physics_articles
dbo:wikiPageWikiLink
dbr:Sensitive_high-resolution_ion_microprobe
Subject Item
dbr:Río_Seco_de_la_Quebrada_Formation
dbo:wikiPageWikiLink
dbr:Sensitive_high-resolution_ion_microprobe
Subject Item
dbr:Geology_of_New_Caledonia
dbo:wikiPageWikiLink
dbr:Sensitive_high-resolution_ion_microprobe
Subject Item
dbr:Sector_mass_spectrometer
dbo:wikiPageWikiLink
dbr:Sensitive_high-resolution_ion_microprobe
Subject Item
dbr:Timeline_of_Australian_inventions
dbo:wikiPageWikiLink
dbr:Sensitive_high-resolution_ion_microprobe
Subject Item
dbr:Christoph_Breitkreuz
dbo:wikiPageWikiLink
dbr:Sensitive_high-resolution_ion_microprobe
Subject Item
dbr:Banded_iron_formation
dbo:wikiPageWikiLink
dbr:Sensitive_high-resolution_ion_microprobe
Subject Item
dbr:Daniela_Rubatto
dbo:wikiPageWikiLink
dbr:Sensitive_high-resolution_ion_microprobe
Subject Item
dbr:Isotope-ratio_mass_spectrometry
dbo:wikiPageWikiLink
dbr:Sensitive_high-resolution_ion_microprobe
Subject Item
dbr:William_Compston
dbo:wikiPageWikiLink
dbr:Sensitive_high-resolution_ion_microprobe
Subject Item
dbr:Provenance_(geology)
dbo:wikiPageWikiLink
dbr:Sensitive_high-resolution_ion_microprobe
Subject Item
dbr:Isua_Greenstone_Belt
dbo:wikiPageWikiLink
dbr:Sensitive_high-resolution_ion_microprobe
Subject Item
dbr:Grenville_orogeny
dbo:wikiPageWikiLink
dbr:Sensitive_high-resolution_ion_microprobe
Subject Item
dbr:Radiometric_dating
dbo:wikiPageWikiLink
dbr:Sensitive_high-resolution_ion_microprobe
Subject Item
dbr:Secondary_ion_mass_spectrometry
dbo:wikiPageWikiLink
dbr:Sensitive_high-resolution_ion_microprobe
Subject Item
dbr:Shrimp_(disambiguation)
dbo:wikiPageWikiLink
dbr:Sensitive_high-resolution_ion_microprobe
Subject Item
dbr:Oldest_dated_rocks
dbo:wikiPageWikiLink
dbr:Sensitive_high-resolution_ion_microprobe
Subject Item
dbr:Monazite_geochronology
dbo:wikiPageWikiLink
dbr:Sensitive_high-resolution_ion_microprobe
Subject Item
dbr:Sensitive_high-resolution_ion_microprobe
rdf:type
dbo:Agent
rdfs:label
SHRIMP Sensitive high-resolution ion microprobe Sensitive High Resolution Ion Microprobe
rdfs:comment
Die Sensitive High Resolution Ion Microprobe (kurz SHRIMP) ist ein Instrument auf der Basis eines doppelt fokussierenden Sekundärionen-Massenspektrometers (SIMS) mit großem Durchmesser. Das Instrument wird ebenso wie seine Nachfolger SHRIMP II und IV von der australischen Firma Australian Scientific Instruments (ASI) in Canberra produziert. Die SHRIMP-Mikrosonde benutzt einen Ionen-Strahl zur Erzeugung sekundärer Ionen, die vom Massenspektrometer nach ihrer Masse und Energie getrennt und in einem Zähler gesammelt werden. SHRIMP ist im eigentlichen Sinne kein Gattungsbegriff, sondern eine Produktbezeichnung von ASI.Eine ähnliche Sekundärionen-Mikrosonde mit großem Magnetradius wird von der Firma Cameca in Paris unter dem Namen IMS1280-HR angeboten. Sie unterscheidet sich in ihrer zusätzlich 高感度高分解能イオンマイクロプローブ（こうかんどこうぶんかいのう-、英: Sensitive high-resolution ion microprobe、通称SHRIMP）とは、二次イオン質量分析器を搭載したイオン顕微鏡である。イオンを走査する事により、三次元的な同位体の分布を調べる事ができる装置で、Australian Scientific Instruments社とオーストラリア国立大学の共同で開発された。 この顕微鏡は主にウラン・鉛年代測定法で利用されるが、δ7Liやδ11Bなど他の元素の同位体比測定にも利用される。 The sensitive high-resolution ion microprobe (also sensitive high mass-resolution ion microprobe or SHRIMP) is a large-diameter, double-focusing secondary ion mass spectrometer (SIMS) sector instrument produced by Australian Scientific Instruments in Canberra, Australia. Similar to the IMS 1270-1280-1300 large-geometry ion microprobes produced by CAMECA, Gennevilliers, France and like other SIMS instruments, the SHRIMP microprobe bombards a sample under vacuum with a beam of primary ions that sputters secondary ions that are focused, filtered, and measured according to their energy and mass.
foaf:depiction
n14:SHRIMP_diagram.svg n14:SHRIP_II.jpg
dcterms:subject
dbc:Mass_spectrometry dbc:Geochronological_dating_methods
dbo:wikiPageID
1357593
dbo:wikiPageRevisionID
1080222949
dbo:wikiPageWikiLink
dbr:Sensitive_high_mass-resolution_ion_microprobe dbr:Köhler_illumination dbr:Jack_Hills dbr:John_Robert_de_Laeter dbr:Lorentz_force dbr:Curtin_University dbr:Thorium dbr:CAMECA dbr:Snowball_Earth dbr:Sputtering dbr:Metamorphic_rock dbr:Electron_multiplier dbr:Isotope dbr:Uranium-lead_dating dbr:Apatite dbr:Nickel dbr:Zircons n9:SHRIP_II.JPG dbr:Mass_resolution dbr:Secondary_ionization dbr:Acasta_Gneiss dbr:Collimated_light dbc:Mass_spectrometry dbr:Sulfur dbr:Microprobe dbr:William_Compston dbr:Ions dbr:Duoplasmatron dbr:Uranium dbr:Metre dbr:Ordovician dbr:Lead dbr:Titanium dbr:Turbomolecular_pump dbr:Research_School_of_Earth_Sciences dbr:Australian_National_University dbr:Igneous_rock dbr:Cryopump dbc:Geochronological_dating_methods dbr:Hadean dbr:Canberra,_Australia n9:SHRIMP_diagram.svg dbr:Oldest_dated_rocks dbr:Sector_instrument dbr:Hafnium dbr:Sea_surface_temperature dbr:Electrostatic_analyzer dbr:Geochronology dbr:Secondary_ion_mass_spectrometry
dbo:wikiPageExternalLink
n20: n21:
owl:sameAs
freebase:m.04wf_0 dbpedia-ja:SHRIMP dbpedia-de:Sensitive_High_Resolution_Ion_Microprobe n16:54AFA wikidata:Q906601
dbp:wikiPageUsesTemplate
dbt:Reflist dbt:Expand_section dbt:Use_dmy_dates dbt:Redirect dbt:Annotated_image
dbo:thumbnail
n14:SHRIP_II.jpg?width=300
dbp:imageLeft
10
dbp:imageTop
10
dbp:caption
Schematic diagram of a SHRIMP instrument illustrating the ion beam path. After Figure 4, Williams, 1998.
dbp:float
float
dbp:height
350
dbp:imageWidth
600
dbp:width
620
dbo:abstract
The sensitive high-resolution ion microprobe (also sensitive high mass-resolution ion microprobe or SHRIMP) is a large-diameter, double-focusing secondary ion mass spectrometer (SIMS) sector instrument produced by Australian Scientific Instruments in Canberra, Australia. Similar to the IMS 1270-1280-1300 large-geometry ion microprobes produced by CAMECA, Gennevilliers, France and like other SIMS instruments, the SHRIMP microprobe bombards a sample under vacuum with a beam of primary ions that sputters secondary ions that are focused, filtered, and measured according to their energy and mass. The SHRIMP is primarily used for geological and geochemical applications. It can measure the isotopic and elemental abundances in minerals at a 10 to 30 μm-diameter scale and with a depth resolution of 1–5 μm. Thus, SIMS method is well-suited for the analysis of complex minerals, as often found in metamorphic terrains, some igneous rocks, and for relatively rapid analysis of statistical valid sets of detrital minerals from sedimentary rocks. The most common application of the instrument is in uranium-thorium-lead geochronology, although the SHRIMP can be used to measure some other isotope ratio measurements (e.g., δ7Li or δ11B) and trace element abundances. 高感度高分解能イオンマイクロプローブ（こうかんどこうぶんかいのう-、英: Sensitive high-resolution ion microprobe、通称SHRIMP）とは、二次イオン質量分析器を搭載したイオン顕微鏡である。イオンを走査する事により、三次元的な同位体の分布を調べる事ができる装置で、Australian Scientific Instruments社とオーストラリア国立大学の共同で開発された。 この顕微鏡は主にウラン・鉛年代測定法で利用されるが、δ7Liやδ11Bなど他の元素の同位体比測定にも利用される。 Die Sensitive High Resolution Ion Microprobe (kurz SHRIMP) ist ein Instrument auf der Basis eines doppelt fokussierenden Sekundärionen-Massenspektrometers (SIMS) mit großem Durchmesser. Das Instrument wird ebenso wie seine Nachfolger SHRIMP II und IV von der australischen Firma Australian Scientific Instruments (ASI) in Canberra produziert. Die SHRIMP-Mikrosonde benutzt einen Ionen-Strahl zur Erzeugung sekundärer Ionen, die vom Massenspektrometer nach ihrer Masse und Energie getrennt und in einem Zähler gesammelt werden. SHRIMP ist im eigentlichen Sinne kein Gattungsbegriff, sondern eine Produktbezeichnung von ASI.Eine ähnliche Sekundärionen-Mikrosonde mit großem Magnetradius wird von der Firma Cameca in Paris unter dem Namen IMS1280-HR angeboten. Sie unterscheidet sich in ihrer zusätzlichen Funktion als Ionenmikroskop, also der Möglichkeit eine direkte massenselektierte Abbildung der Probe zu erstellen; einer verbesserten Massenauflösung und der Fähigkeit die Isotopenzusammensetzung in kleinen Partikeln automatisch zu messen.
dbp:imagemap
Image:SHRIMP diagram.svg
gold:hypernym
dbr:Instrument
prov:wasDerivedFrom
wikipedia-en:Sensitive_high-resolution_ion_microprobe?oldid=1080222949&ns=0
dbo:wikiPageLength
29375
foaf:isPrimaryTopicOf
wikipedia-en:Sensitive_high-resolution_ion_microprobe
Subject Item
dbr:Oxygen-18
dbo:wikiPageWikiLink
dbr:Sensitive_high-resolution_ion_microprobe
Subject Item
dbr:SHRIMP
dbo:wikiPageWikiLink
dbr:Sensitive_high-resolution_ion_microprobe
dbo:wikiPageRedirects
dbr:Sensitive_high-resolution_ion_microprobe
Subject Item
dbr:Sensitive_high_resolution_ion_microprobe
dbo:wikiPageWikiLink
dbr:Sensitive_high-resolution_ion_microprobe
dbo:wikiPageRedirects
dbr:Sensitive_high-resolution_ion_microprobe
Subject Item
wikipedia-en:Sensitive_high-resolution_ion_microprobe
foaf:primaryTopic
dbr:Sensitive_high-resolution_ion_microprobe