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Material analysis instrument primarily used for geological and geochemical applications

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dbo:description
  • material analysis instrument primarily used for geological and geochemical applications (en)
  • Instrument in der Geochronologie (de)
  • 二次イオン質量分析器を搭載したイオン顕微鏡 (ja)
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  • Schematic diagram of a SHRIMP instrument illustrating the ion beam path. After Figure 4, Williams, 1998. (en)
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  • float (en)
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  • 275 (xsd:integer)
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  • 10 (xsd:integer)
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  • 10 (xsd:integer)
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  • 450 (xsd:integer)
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  • Image:SHRIMP diagram.svg (en)
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  • 450 (xsd:integer)
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  • Sensitive high-resolution ion microprobe (en)
  • Sensitive High Resolution Ion Microprobe (de)
  • SHRIMP (ja)
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