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About:
Reliability (semiconductor)
An Entity of Type:
Thing
,
from Named Graph:
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within Data Space:
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Reliability of semiconductor-based electronic components
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dbo:
description
توانایی افزاره برای انجام کارکرد مورد نظر خود در طولعمر افزاره در صحنه عمل است
(fa)
es pot relacionar amb la corba de la taxa de fallada anomenada: corba de la banyera.
(ca)
reliability of semiconductor-based electronic components
(en)
dbo:
wikiPageExternalLink
http://parts.jpl.nasa.gov/mmic/4.PDF
https://vbn.aau.dk/da/publications/81f0ae92-f0e2-4608-88a7-6a7c17ae8375
http://documentation.renesas.com/eng/products/others/rej27l0001_reliabilityhb.pdf
http://www.enre.umd.edu/publications/rs&h.htm
https://web.archive.org/web/20051108142529/http:/www.enre.umd.edu/publications/rs&h.htm
https://web.archive.org/web/20061201114214/http:/documentation.renesas.com/eng/products/others/rej27l0001_reliabilityhb.pdf
dbo:
wikiPageWikiLink
dbr
:Automotive_Electronics_Council
dbr
:Cleanroom
dbr
:Final_test
dbr
:Fracture
dbr
:Vibration
dbr
:Temperature
dbr
:Failure_analysis
dbr
:Ohmic_contact
dbr
:Electric_current
dbr
:Gas
dbr
:Semiconductor
dbr
:Voltage
dbr
:Dust
dbr
:Time_to_market
dbr
:Latch-up
dbr
:Overvoltage
dbr
:Derating
dbr
:Electromigration
dbr
:Field-effect_transistor
dbr
:Radiation
dbc
:Semiconductor_device_fabrication
dbr
:Pressure
dbr
:Shock_(mechanics)
dbr
:Economy_of_scale
dbr
:Burn-in
dbr
:Overcurrent
dbr
:Wire_bonding
dbr
:Metastability
dbr
:Non-recurring_engineering
dbr
:List_of_semiconductor_materials
dbr
:List_of_materials-testing_resources
dbr
:List_of_materials_analysis_methods
dbr
:Logic_simulation
dbr
:Humidity
dbr
:Electric_power
dbr
:Electrostatic_discharge
dbr
:Metallizing
dbr
:Process_control
dbr
:Transistor_aging
dbr
:Magnetic
dbr
:Wafer_prober
dbr
:HIRF
dbr
:Electrical
dbr
:Thin_films
dbr
:Timing_analysis
dbr
:Injection_molding
dbr
:Cleanrooms
dbr
:Mechanical_stress
dbp:
wikiPageUsesTemplate
dbt
:Cite_book
dbt
:Cite_web
dbt
:Reflist
dbt
:Cite_journal
dbt
:Multiple_issues
dbt
:Citation
dbt
:Lead_rewrite
dbt
:Technical
dbt
:Full
dct:
subject
dbc
:Semiconductor_device_fabrication
rdfs:
label
Reliability (semiconductor)
(en)
Fiabilitat (semiconductors)
(ca)
半导体器件可靠性
(zh)
owl:
sameAs
freebase
:Reliability (semiconductor)
wikidata
:Reliability (semiconductor)
dbpedia-zh
:Reliability (semiconductor)
dbpedia-ca
:Reliability (semiconductor)
dbpedia-global
:Reliability (semiconductor)
prov:
wasDerivedFrom
wikipedia-en
:Reliability_(semiconductor)?oldid=1292344658&ns=0
foaf:
isPrimaryTopicOf
wikipedia-en
:Reliability_(semiconductor)
is
dbo:
wikiPageDisambiguates
of
dbr
:Reliability
is
dbo:
wikiPageWikiLink
of
dbr
:Tibor_Grasser
dbr
:Reliability
dbr
:Semiconductor_device
dbr
:System_on_a_chip
dbr
:Integrated_circuit_design
dbr
:Hot-carrier_injection
dbr
:Failure_of_electronic_components
dbr
:MOSFET
dbr
:QBD_(electronics)
dbr
:DO-160
dbr
:Glass_frit_bonding
dbr
:Sherlock_Automated_Design_Analysis
dbr
:Chenming_Hu
dbr
:Transistor_aging
dbr
:Luca_Selmi
dbr
:High-temperature_operating_life
dbr
:Robert_F._Smith_(investor)
is
rdfs:
seeAlso
of
dbr
:Failure_of_electronic_components
is
foaf:
primaryTopic
of
wikipedia-en
:Reliability_(semiconductor)
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