Browse using
OpenLink Faceted Browser
OpenLink Structured Data Editor
LodLive Browser
Formats
RDF:
N-Triples
N3
Turtle
JSON
XML
OData:
Atom
JSON
Microdata:
JSON
HTML
Embedded:
JSON
Turtle
Other:
CSV
JSON-LD
Faceted Browser
Sparql Endpoint
About:
Device under test
An Entity of Type:
Thing
,
from Named Graph:
http://dbpedia.org
,
within Data Space:
dbpedia.org
Equipment Under Test
Property
Value
dbo:
description
Equipment Under Test
(en)
zu prüfendes Objekt
(de)
dbo:
wikiPageWikiLink
dbr
:Die_(integrated_circuit)
dbc
:Environmental_testing
dbc
:Product_testing
dbr
:Wafer_(electronics)
dbr
:Zero_insertion_force
dbr
:Pogo_pin
dbr
:Product_testing
dbc
:Semiconductor_device_fabrication
dbc
:Electronic_engineering
dbr
:Automatic_test_equipment
dbc
:Automatic_test_equipment
dbr
:System_under_test
dbr
:Test_bench
dbr
:Printed_circuit_board
dbc
:Hardware_testing
dbr
:DUT_board
dbr
:Bed_of_nails_tester
dbr
:Packaged_part
dbr
:Semiconductor_curve_tracer
dbp:
wikiPageUsesTemplate
dbt
:Reflist
dbt
:Tech-stub
dbt
:Short_description
dct:
subject
dbc
:Environmental_testing
dbc
:Product_testing
dbc
:Semiconductor_device_fabrication
dbc
:Electronic_engineering
dbc
:Automatic_test_equipment
dbc
:Hardware_testing
gold:
hypernym
dbr
:Term
rdfs:
label
Device under test
(en)
Device Under Test
(de)
テスト対象デバイス
(ja)
被测器件
(zh)
owl:
sameAs
freebase
:Device under test
wikidata
:Device under test
dbpedia-de
:Device under test
dbpedia-zh
:Device under test
dbpedia-ja
:Device under test
dbpedia-global
:Device under test
prov:
wasDerivedFrom
wikipedia-en
:Device_under_test?oldid=1292070959&ns=0
foaf:
isPrimaryTopicOf
wikipedia-en
:Device_under_test
is
dbo:
wikiPageDisambiguates
of
dbr
:DUT
is
dbo:
wikiPageRedirects
of
dbr
:Equipment_under_test
dbr
:Unit_under_test
dbr
:Device_Under_Test
dbr
:Devices_Under_Test
dbr
:Unit_Under_Test
is
dbo:
wikiPageWikiLink
of
dbr
:Calibration
dbr
:Test_fixture
dbr
:Abbreviated_Test_Language_for_All_Systems
dbr
:Insertion_loss
dbr
:LAN_eXtensions_for_Instrumentation
dbr
:Scattering_parameters
dbr
:Triaxial_cable
dbr
:LCR_meter
dbr
:Highly_accelerated_life_test
dbr
:Capacitance
dbr
:SystemVerilog
dbr
:Xilinx_ISE
dbr
:DUT
dbr
:Test_probe
dbr
:Mass_interconnect
dbr
:Functional_testing_(manufacturing)
dbr
:Pogo_pin
dbr
:TEM_cell
dbr
:Current_injection_technique
dbr
:RF_switch
dbr
:Bit_error_rate
dbr
:Automatic_test_equipment
dbr
:Electronic_test_equipment
dbr
:Contactor
dbr
:Plot_(graphics)
dbr
:Network_analyzer_(electrical)
dbr
:Partial_discharge
dbr
:System_under_test
dbr
:Transmission-line_pulse
dbr
:Test_bench
dbr
:Standard_Test_Data_Format
dbr
:Test_engineer
dbr
:Random_test_generator
dbr
:Packet_analyzer
dbr
:Capacitance_meter
dbr
:Isolation_transformer
dbr
:Electrostatic_discharge
dbr
:Bead_probe_technology
dbr
:ESD_simulator
dbr
:Synthetic_instrument
dbr
:DUT_board
dbr
:Human-body_model
dbr
:Shmoo_plot
dbr
:Signal_tracer
dbr
:Mobile-device_testing
dbr
:RF_switch_matrix
dbr
:Conducted_emissions
dbr
:Bed_of_nails_tester
dbr
:Equipment_under_test
dbr
:IEC_61000-4-2
dbr
:Slotted_line
dbr
:Unit_under_test
dbr
:Semiconductor_curve_tracer
dbr
:Device_Under_Test
dbr
:Devices_Under_Test
dbr
:Unit_Under_Test
is
foaf:
primaryTopic
of
wikipedia-en
:Device_under_test
This content was extracted from
Wikipedia
and is licensed under the
Creative Commons Attribution-ShareAlike 4.0 International