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Photoemission electron microscopy (PEEM, also called photoelectron microscopy, PEM) is a type of electron microscopy that utilizes local variations in electron emission to generate image contrast. The excitation is usually produced by ultraviolet light, synchrotron radiation or X-ray sources. PEEM measures the coefficient indirectly by collecting the emitted secondary electrons generated in the electron cascade that follows the creation of the primary core hole in the absorption process. PEEM is a surface sensitive technique because the emitted electrons originate from a shallow layer. In physics, this technique is referred to as PEEM, which goes together naturally with low-energy electron diffraction (LEED), and low-energy electron microscopy (LEEM). In biology, it is called photoelectron

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  • Photoemissionselektronenmikroskopie (de)
  • 光電子顕微鏡 (ja)
  • Photoemission electron microscopy (en)
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  • Die Photoemissionselektronenmikroskopie (englisch photo emission electron microscopy, PEEM) ist eine mit der Photoelektronenspektroskopie (PES) und der Elektronenmikroskopie verwandte, analytische Methode zur Untersuchung von Oberflächenphänomenen. Sie ist charakterisiert durch die Aufnahme einer zweidimensionalen Intensitätsverteilung der Photoelektronen und ergibt somit ein vergrößertes Bild der Probenoberfläche. Es handelt sich somit, charakteristisch für Mikroskope, um eine abbildende Messtechnik. (de)
  • 光電子顕微鏡（こうでんしけんびきょう、Photoemission Electron microscopy : PEEM）は放射光を利用した顕微鏡。 (ja)
  • Photoemission electron microscopy (PEEM, also called photoelectron microscopy, PEM) is a type of electron microscopy that utilizes local variations in electron emission to generate image contrast. The excitation is usually produced by ultraviolet light, synchrotron radiation or X-ray sources. PEEM measures the coefficient indirectly by collecting the emitted secondary electrons generated in the electron cascade that follows the creation of the primary core hole in the absorption process. PEEM is a surface sensitive technique because the emitted electrons originate from a shallow layer. In physics, this technique is referred to as PEEM, which goes together naturally with low-energy electron diffraction (LEED), and low-energy electron microscopy (LEEM). In biology, it is called photoelectron (en)
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  • http://commons.wikimedia.org/wiki/Special:FilePath/PEEM_figure3.jpg
  • http://commons.wikimedia.org/wiki/Special:FilePath/PEEM_figure4.jpg
  • http://commons.wikimedia.org/wiki/Special:FilePath/PEEM_figure5.jpg
  • http://commons.wikimedia.org/wiki/Special:FilePath/PEEM_figure6.jpg
  • http://commons.wikimedia.org/wiki/Special:FilePath/PEEM_figure7.jpg
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  • Die Photoemissionselektronenmikroskopie (englisch photo emission electron microscopy, PEEM) ist eine mit der Photoelektronenspektroskopie (PES) und der Elektronenmikroskopie verwandte, analytische Methode zur Untersuchung von Oberflächenphänomenen. Sie ist charakterisiert durch die Aufnahme einer zweidimensionalen Intensitätsverteilung der Photoelektronen und ergibt somit ein vergrößertes Bild der Probenoberfläche. Es handelt sich somit, charakteristisch für Mikroskope, um eine abbildende Messtechnik. (de)
  • Photoemission electron microscopy (PEEM, also called photoelectron microscopy, PEM) is a type of electron microscopy that utilizes local variations in electron emission to generate image contrast. The excitation is usually produced by ultraviolet light, synchrotron radiation or X-ray sources. PEEM measures the coefficient indirectly by collecting the emitted secondary electrons generated in the electron cascade that follows the creation of the primary core hole in the absorption process. PEEM is a surface sensitive technique because the emitted electrons originate from a shallow layer. In physics, this technique is referred to as PEEM, which goes together naturally with low-energy electron diffraction (LEED), and low-energy electron microscopy (LEEM). In biology, it is called photoelectron microscopy (PEM), which fits with photoelectron spectroscopy (PES), transmission electron microscopy (TEM), and scanning electron microscopy (SEM). (en)
  • 光電子顕微鏡（こうでんしけんびきょう、Photoemission Electron microscopy : PEEM）は放射光を利用した顕微鏡。 (ja)
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