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About: Failure of electronic components     Goto   Sponge   NotDistinct   Permalink

An Entity of Type : yago:WikicatFans, within Data Space : dbpedia.org associated with source document(s)

Type: Thingyago:Advocate109774783yago:CausalAgent100007347yago:Enthusiast110059582yago:LivingThing100004258yago:Object100002684yago:Organism100004475yago:Person100007846yago:PhysicalEntity100001930yago:YagoLegalActoryago:YagoLegalActorGeoyago:SportsFan110639925yago:Supporter110677713yago:Whole100003553yago:WikicatFans New Facet based on Instances of this Class

Electronic components have a wide range of failure modes. These can be classified in various ways, such as by time or cause. Failures can be caused by excess temperature, excess current or voltage, ionizing radiation, mechanical shock, stress or impact, and many other causes. In semiconductor devices, problems in the device package may cause failures due to contamination, mechanical stress of the device, or open or short circuits.