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dbr:Surface_photovoltage
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Oberflächenphotospannung Surface photovoltage
rdfs:comment
Surface photovoltage (SPV) measurements are a widely used method to determine the minority carrier of semiconductors. Since the transport of minority carriers determines the behavior of the p-n junctions that are ubiquitous in semiconductor devices, surface photovoltage data can be very helpful in understanding their performance. As a contactless method, SPV is a popular technique for characterizing poorly understood compound semiconductors where the fabrication of ohmic contacts or special device structures may be difficult. Die Oberflächenphotospannung (englisch surface photovoltage, SPV) ist eine Messgröße zur Bestimmung der Diffusionslänge von Minoritätsladungsträgern in Halbleitern. Da der Transport von Minoritätsladungsträgern das Verhalten der p-n-Übergänge bestimmt, die in Halbleiterbauelementen vielfach vorkommen, wird die Oberflächenphotospannung verwendet, um deren Leistung zu analysieren. Als kontaktlose Methode ist die Oberflächenphotospannung eine beliebte Technik zur Charakterisierung von Verbindungshalbleitern, bei denen die Herstellung von ohmschen Kontakten oder speziellen Bauteilstrukturen schwierig sein kann.
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Die Oberflächenphotospannung (englisch surface photovoltage, SPV) ist eine Messgröße zur Bestimmung der Diffusionslänge von Minoritätsladungsträgern in Halbleitern. Da der Transport von Minoritätsladungsträgern das Verhalten der p-n-Übergänge bestimmt, die in Halbleiterbauelementen vielfach vorkommen, wird die Oberflächenphotospannung verwendet, um deren Leistung zu analysieren. Als kontaktlose Methode ist die Oberflächenphotospannung eine beliebte Technik zur Charakterisierung von Verbindungshalbleitern, bei denen die Herstellung von ohmschen Kontakten oder speziellen Bauteilstrukturen schwierig sein kann. Surface photovoltage (SPV) measurements are a widely used method to determine the minority carrier of semiconductors. Since the transport of minority carriers determines the behavior of the p-n junctions that are ubiquitous in semiconductor devices, surface photovoltage data can be very helpful in understanding their performance. As a contactless method, SPV is a popular technique for characterizing poorly understood compound semiconductors where the fabrication of ohmic contacts or special device structures may be difficult.
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