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rdfs:label: 微分干涉相差显微镜 Microscopia a contrasto di interferenza differenziale Differentialinterferenzkontrast Differential interference contrast microscopy Дифференциальный интерференционно-контрастный микроскоп 微分干渉顕微鏡 Microscope à contraste interférentiel
rdfs:comment: 微分干涉相差显微技术(DIC),又称Nomarski干涉相差显微技术或Nomarski显微镜,是一种增强对比度来观察未染色的透明的样品的光学显微镜。DIC根据干涉测量获取有关样品信息，以查看其他不可见的特征。相对复杂的光学系统产生具有灰色背景的黑色或白色的图像。该图像类似于通过相差显微镜获得的但没有明亮衍射光晕的图像。该技术由波兰物理学家在1952年研发。 DIC通过将偏振光源分离成在样品平面上空间位移（剪切）的两个正交偏振相干部分，并在观察之前重组。复合时两部分的干涉对其光程差（即折射率乘积和几何路径长度）敏感。添加可调节的偏移相位确定在所述样品中的零光程差的干涉，对比度是正比于沿剪切方向的路径长度梯度，得到三维的光密度变化的样本图像，图像强调线条和边缘，但不提供表面上准确的图像。 Differential interference contrast (DIC) microscopy, also known as Nomarski interference contrast (NIC) or Nomarski microscopy, is an optical microscopy technique used to enhance the contrast in unstained, transparent samples. DIC works on the principle of interferometry to gain information about the optical path length of the sample, to see otherwise invisible features. A relatively complex optical system produces an image with the object appearing black to white on a grey background. This image is similar to that obtained by phase contrast microscopy but without the bright diffraction halo. The technique was developed by Polish physicist Georges Nomarski in 1952. La microscopia a contrasto di interferenza differenziale è una tecnica di microscopia ottica utilizzata per migliorare il contrasto nei campioni non colorati, trasparenti. Funziona sul principio dell'interferometria per ottenere informazioni sulla lunghezza del cammino ottico del campione, permettendo di osservare caratteristiche altrimenti invisibili. Un sistema ottico relativamente complesso produce un'immagine dove l'oggetto, se incolore e trasparente, appare in bianco e nero su sfondo grigio. Migliora il contrasto creando ombre artificiali, come se l'oggetto fosse illuminato lateralmente. L'immagine ottenuta è simile a quella ottenuta con la microscopia a contrasto di fase ma senza l'alone di diffrazione luminoso. La tecnica è stata sviluppata dal fisico Georges Nomarski nel 1952. Le microscope à contraste interférentiel est un microscope qui exploite les interférences de deux faisceaux d'une onde lumineuse traversant un échantillon. Il existe en fait plusieurs techniques de contraste interférentiel en microscopie. On peut classer les microscopes interférentiels en deux grands groupes : * ceux où un faisceau lumineux qui ne traverse pas l'objet sert de référence (KRUG, LAU, objectif de MIRAU, de WATSON...) Cette technique impose des microscopes à statif spécial qui ne se rencontrent plus qu'en métallographie. Parmi ces derniers, il faut encore distinguer : 微分干渉顕微鏡（びぶんかんしょうけんびきょう、Differential interference contrast microscope; DIC）は光学顕微鏡の一種で、非染色の試料のコントラストを高めて観察する事ができる装置である。光学系の中核を為すプリズム（Nomarski prism）の開発者であるノマルスキー（Georges Nomarski）の名から、ノマルスキー型微分干渉顕微鏡などとも呼ばれる。 Дифференциальная интерференционно-контрастная микроскопия (интерференционно-контрастная микроскопия или микроскопия Номарского) — световая оптическая микроскопия, используемая для создания контраста в неокрашенных прозрачных образцах. ДИК-микроскоп позволяет определить оптическую плотность исследуемого объекта, используя интерференцию света, и таким образом увидеть недоступные глазу детали. Относительно сложная оптическая система позволяет создать чёрно-белую картину образца на сером фоне. Это изображение подобно тому, которое можно получить с помощью фазово-контрастного микроскопа, но в нём отсутствует дифракционное гало. Der Differentialinterferenzkontrast (auch: differentieller Interferenzkontrast, Differential-Interferenz-Kontrast oder Nomarski-Kontrast, abgekürzt DIK oder DIC von englisch differential interference contrast) ist eine Methode der abbildenden Lichtmikroskopie, die Unterschiede in der optischen Weglänge im betrachteten Objekt in Helligkeitsunterschiede des Bildes umwandelt. Dadurch können transparente Phasenobjekte sichtbar gemacht werden. Im Auflicht gibt der Bildkontrast die Änderungen der Oberflächenmorphologie wieder. Im Durchlicht entstehen plastische Bilder des Objekts. Dabei beruht der Bildkontrast auf lokalen Variationen der optischen Weglänge des Lichts in der Probe. Das Bild entspricht also der lokalen Änderung (Gradient) des Brechungsindex der Probe (daher die Bezeichnung "differ
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dbo:abstract: Le microscope à contraste interférentiel est un microscope qui exploite les interférences de deux faisceaux d'une onde lumineuse traversant un échantillon. Il existe en fait plusieurs techniques de contraste interférentiel en microscopie. On peut classer les microscopes interférentiels en deux grands groupes : * ceux où un faisceau lumineux qui ne traverse pas l'objet sert de référence (KRUG, LAU, objectif de MIRAU, de WATSON...) Cette technique impose des microscopes à statif spécial qui ne se rencontrent plus qu'en métallographie. * ceux où les deux faisceaux lumineux à l'origine d'interférences traversent l'objet.(FRANCON, JAMIN/LEBEDEFF, SMITH, NOMARSKI, PLUTA...) Parmi ces derniers, il faut encore distinguer : - les microscopes d’interférométrie à large dédoublement (CI Shearing, interféromètres à franges d'interférences) qui sont destinés à des mesures précises de structures d'objets. - les microscopes à contraste interférentiel différentiel qui permet une visualisation appréciée des objets avec un dédoublement inférieur à la limite de résolution de l'objectif. Ils donnent des images avec un pseudo relief typique du procédé. Actuellement, le contraste interférentiel le plus répandu est le contraste interférentiel différentiel (CID, DIC des anglophones), plus particulièrement le contraste interférentiel selon Nomarski (CIN, NIC des anglophones). C'est ce dernier auquel correspond en langage courant le "microscope à contraste interférentiel". La microscopia a contrasto di interferenza differenziale è una tecnica di microscopia ottica utilizzata per migliorare il contrasto nei campioni non colorati, trasparenti. Funziona sul principio dell'interferometria per ottenere informazioni sulla lunghezza del cammino ottico del campione, permettendo di osservare caratteristiche altrimenti invisibili. Un sistema ottico relativamente complesso produce un'immagine dove l'oggetto, se incolore e trasparente, appare in bianco e nero su sfondo grigio. Migliora il contrasto creando ombre artificiali, come se l'oggetto fosse illuminato lateralmente. L'immagine ottenuta è simile a quella ottenuta con la microscopia a contrasto di fase ma senza l'alone di diffrazione luminoso. La tecnica è stata sviluppata dal fisico Georges Nomarski nel 1952. Diatomee osservate con la microscopia a contrasto di fase e con microscopia a contrasto di interferenza differenziale 微分干涉相差显微技术(DIC),又称Nomarski干涉相差显微技术或Nomarski显微镜,是一种增强对比度来观察未染色的透明的样品的光学显微镜。DIC根据干涉测量获取有关样品信息，以查看其他不可见的特征。相对复杂的光学系统产生具有灰色背景的黑色或白色的图像。该图像类似于通过相差显微镜获得的但没有明亮衍射光晕的图像。该技术由波兰物理学家在1952年研发。 DIC通过将偏振光源分离成在样品平面上空间位移（剪切）的两个正交偏振相干部分，并在观察之前重组。复合时两部分的干涉对其光程差（即折射率乘积和几何路径长度）敏感。添加可调节的偏移相位确定在所述样品中的零光程差的干涉，对比度是正比于沿剪切方向的路径长度梯度，得到三维的光密度变化的样本图像，图像强调线条和边缘，但不提供表面上准确的图像。微分干渉顕微鏡（びぶんかんしょうけんびきょう、Differential interference contrast microscope; DIC）は光学顕微鏡の一種で、非染色の試料のコントラストを高めて観察する事ができる装置である。光学系の中核を為すプリズム（Nomarski prism）の開発者であるノマルスキー（Georges Nomarski）の名から、ノマルスキー型微分干渉顕微鏡などとも呼ばれる。 Differential interference contrast (DIC) microscopy, also known as Nomarski interference contrast (NIC) or Nomarski microscopy, is an optical microscopy technique used to enhance the contrast in unstained, transparent samples. DIC works on the principle of interferometry to gain information about the optical path length of the sample, to see otherwise invisible features. A relatively complex optical system produces an image with the object appearing black to white on a grey background. This image is similar to that obtained by phase contrast microscopy but without the bright diffraction halo. The technique was developed by Polish physicist Georges Nomarski in 1952. DIC works by separating a polarized light source into two orthogonally polarized mutually coherent parts which are spatially displaced (sheared) at the sample plane, and recombined before observation. The interference of the two parts at recombination is sensitive to their optical path difference (i.e. the product of refractive index and geometric path length). Adding an adjustable offset phase determining the interference at zero optical path difference in the sample, the contrast is proportional to the path length gradient along the shear direction, giving the appearance of a three-dimensional physical relief corresponding to the variation of optical density of the sample, emphasising lines and edges though not providing a topographically accurate image. Der Differentialinterferenzkontrast (auch: differentieller Interferenzkontrast, Differential-Interferenz-Kontrast oder Nomarski-Kontrast, abgekürzt DIK oder DIC von englisch differential interference contrast) ist eine Methode der abbildenden Lichtmikroskopie, die Unterschiede in der optischen Weglänge im betrachteten Objekt in Helligkeitsunterschiede des Bildes umwandelt. Dadurch können transparente Phasenobjekte sichtbar gemacht werden. Im Auflicht gibt der Bildkontrast die Änderungen der Oberflächenmorphologie wieder. Im Durchlicht entstehen plastische Bilder des Objekts. Dabei beruht der Bildkontrast auf lokalen Variationen der optischen Weglänge des Lichts in der Probe. Das Bild entspricht also der lokalen Änderung (Gradient) des Brechungsindex der Probe (daher die Bezeichnung "differentieller" Bildkontrast). Дифференциальная интерференционно-контрастная микроскопия (интерференционно-контрастная микроскопия или микроскопия Номарского) — световая оптическая микроскопия, используемая для создания контраста в неокрашенных прозрачных образцах. ДИК-микроскоп позволяет определить оптическую плотность исследуемого объекта, используя интерференцию света, и таким образом увидеть недоступные глазу детали. Относительно сложная оптическая система позволяет создать чёрно-белую картину образца на сером фоне. Это изображение подобно тому, которое можно получить с помощью фазово-контрастного микроскопа, но в нём отсутствует дифракционное гало. В ДИК-микроскопе поляризованный луч из источника света разделяется на два луча, которые проходят через образец разными оптическими путями. Длина этих оптических путей (то есть произведение показателя преломления и геометрической длины пути) различна. Впоследствии эти лучи интерферируют при слиянии. Это позволяет создать объемное рельефное изображение, соответствующее изменению оптической плотности образца, акцентируя линии и границы. Эта картина не является точной топографической картиной.
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