This HTML5 document contains 56 embedded RDF statements represented using HTML+Microdata notation.

The embedded RDF content will be recognized by any processor of HTML5 Microdata.

Namespace Prefixes

PrefixIRI
dbpedia-dehttp://de.dbpedia.org/resource/
dctermshttp://purl.org/dc/terms/
yago-reshttp://yago-knowledge.org/resource/
dbohttp://dbpedia.org/ontology/
foafhttp://xmlns.com/foaf/0.1/
n15https://global.dbpedia.org/id/
yagohttp://dbpedia.org/class/yago/
dbthttp://dbpedia.org/resource/Template:
rdfshttp://www.w3.org/2000/01/rdf-schema#
freebasehttp://rdf.freebase.com/ns/
dbpedia-pthttp://pt.dbpedia.org/resource/
rdfhttp://www.w3.org/1999/02/22-rdf-syntax-ns#
owlhttp://www.w3.org/2002/07/owl#
wikipedia-enhttp://en.wikipedia.org/wiki/
dbchttp://dbpedia.org/resource/Category:
dbphttp://dbpedia.org/property/
provhttp://www.w3.org/ns/prov#
xsdhhttp://www.w3.org/2001/XMLSchema#
wikidatahttp://www.wikidata.org/entity/
goldhttp://purl.org/linguistics/gold/
dbrhttp://dbpedia.org/resource/
dbpedia-jahttp://ja.dbpedia.org/resource/

Statements

Subject Item
dbr:Timeline_of_United_States_inventions_(1946–1991)
dbo:wikiPageWikiLink
dbr:Ballistic_electron_emission_microscopy
Subject Item
dbr:Michael_H._Hecht
dbo:wikiPageWikiLink
dbr:Ballistic_electron_emission_microscopy
Subject Item
dbr:Bai_Chunli
dbo:wikiPageWikiLink
dbr:Ballistic_electron_emission_microscopy
Subject Item
dbr:Ballistic_electron_emission_microscopy
rdf:type
yago:Ability105616246 yago:Cognition100023271 yago:PsychologicalFeature100023100 dbo:TopicalConcept yago:Invention105633385 yago:Creativity105624700 yago:WikicatAmericanInventions yago:Abstraction100002137
rdfs:label
Ballistische Elektronenemissionsmikroskopie Ballistic electron emission microscopy 弾道電子放出顕微鏡 Microscopia por emissão balística de elétrons
rdfs:comment
Die ballistische Elektronenemissionsmikroskopie (kurz BEEM) ist eine Abwandlung der Rastertunnelmikroskopie, sie wurde 1988 durch L. Douglas Bell and William J. Kaiser entwickelt. Mit Hilfe von BEEM lässt sich die Schottky-Barriere an der Grenzfläche eines Metalls zu einem Halbleiter mit einer Nanometer-hohen lateralen Auflösung untersuchen. Ballistic electron emission microscopy or BEEM is a technique for studying ballistic electron transport through a variety of materials and material interfaces. BEEM is a three terminal scanning tunneling microscopy (STM) technique that was invented in 1988 at the Jet Propulsion Laboratory in Pasadena, California by L. Douglas Bell and William Kaiser. The most popular interfaces to study are metal-semiconductor Schottky diodes, but metal-insulator-semiconductor systems can be studied as well. 弾道電子放出顕微鏡（だんどうでんしほうしゅつけんびきょう、Ballistic Electron Emission Microscopy : BEEM）とは弾道電子により画像を得る走査型トンネル顕微鏡の一種。 Microscopia por emissão balística de elétrons (BEEM) é uma forma modificada de um microscópio de tunelamento de varredura (STM) que permite o estudo em nanoescala de transporte de portador de não equilíbrio através de interfaces aterradas. A diferença da configuração STM normal é a adição de um contato de volta para a amostra. Isto torna possível recolher os elétrons injetados que percorreram o dispositivo completo.
dcterms:subject
dbc:American_inventions dbc:Scanning_probe_microscopy
dbo:wikiPageID
17526233
dbo:wikiPageRevisionID
995001105
dbo:wikiPageWikiLink
dbr:Nanometer dbc:American_inventions dbc:Scanning_probe_microscopy dbr:Schottky_barrier dbr:Schottky_diode dbr:Jet_Propulsion_Laboratory dbr:Ballistic_electron_transport dbr:Pasadena,_California dbr:Spatial_resolution dbr:Electron dbr:Atom dbr:Microscopy
owl:sameAs
dbpedia-pt:Microscopia_por_emissão_balística_de_elétrons wikidata:Q4851791 freebase:m.0465wvm n15:4ViZg dbpedia-de:Ballistische_Elektronenemissionsmikroskopie dbpedia-ja:弾道電子放出顕微鏡 yago-res:Ballistic_electron_emission_microscopy
dbp:wikiPageUsesTemplate
dbt:Reflist dbt:SPM2
dbo:abstract
弾道電子放出顕微鏡（だんどうでんしほうしゅつけんびきょう、Ballistic Electron Emission Microscopy : BEEM）とは弾道電子により画像を得る走査型トンネル顕微鏡の一種。 Ballistic electron emission microscopy or BEEM is a technique for studying ballistic electron transport through a variety of materials and material interfaces. BEEM is a three terminal scanning tunneling microscopy (STM) technique that was invented in 1988 at the Jet Propulsion Laboratory in Pasadena, California by L. Douglas Bell and William Kaiser. The most popular interfaces to study are metal-semiconductor Schottky diodes, but metal-insulator-semiconductor systems can be studied as well. When performing BEEM, electrons are injected from a STM tip into a grounded metal base of a Schottky diode. A small fraction of these electrons will travel ballistically through the metal to the metal-semiconductor interface where they will encounter a Schottky barrier. Those electrons with sufficient energy to surmount the Schottky barrier will be detected as the BEEM current. The atomic scale positioning capability of the STM tip gives BEEM nanometer spatial resolution. In addition, the narrow energy distribution of electrons tunneling from the STM tip gives BEEM a high energetic resolution (about 0.02 eV). Die ballistische Elektronenemissionsmikroskopie (kurz BEEM) ist eine Abwandlung der Rastertunnelmikroskopie, sie wurde 1988 durch L. Douglas Bell and William J. Kaiser entwickelt. Mit Hilfe von BEEM lässt sich die Schottky-Barriere an der Grenzfläche eines Metalls zu einem Halbleiter mit einer Nanometer-hohen lateralen Auflösung untersuchen. Microscopia por emissão balística de elétrons (BEEM) é uma forma modificada de um microscópio de tunelamento de varredura (STM) que permite o estudo em nanoescala de transporte de portador de não equilíbrio através de interfaces aterradas. A diferença da configuração STM normal é a adição de um contato de volta para a amostra. Isto torna possível recolher os elétrons injetados que percorreram o dispositivo completo.
gold:hypernym
dbr:Technique
prov:wasDerivedFrom
wikipedia-en:Ballistic_electron_emission_microscopy?oldid=995001105&ns=0
dbo:wikiPageLength
2472
foaf:isPrimaryTopicOf
wikipedia-en:Ballistic_electron_emission_microscopy
Subject Item
dbr:Henning_Sirringhaus
dbo:wikiPageWikiLink
dbr:Ballistic_electron_emission_microscopy
dbo:knownFor
dbr:Ballistic_electron_emission_microscopy
Subject Item
dbr:Scanning_probe_microscopy
dbo:wikiPageWikiLink
dbr:Ballistic_electron_emission_microscopy
Subject Item
wikipedia-en:Ballistic_electron_emission_microscopy
foaf:primaryTopic
dbr:Ballistic_electron_emission_microscopy