This HTML5 document contains 180 embedded RDF statements represented using HTML+Microdata notation.

The embedded RDF content will be recognized by any processor of HTML5 Microdata.

Namespace Prefixes

PrefixIRI
dbpedia-dehttp://de.dbpedia.org/resource/
dcthttp://purl.org/dc/terms/
dbohttp://dbpedia.org/ontology/
n15http://dbpedia.org/resource/File:
foafhttp://xmlns.com/foaf/0.1/
n13https://global.dbpedia.org/id/
n26https://web.archive.org/web/20110713002000/http:/www.icselect.com/pdfs/
n12https://web.archive.org/web/20110903182252/http:/www.all-about-test.eu/
yagohttp://dbpedia.org/class/yago/
dbthttp://dbpedia.org/resource/Template:
rdfshttp://www.w3.org/2000/01/rdf-schema#
freebasehttp://rdf.freebase.com/ns/
n14http://www.radio-electronics.com/info/t_and_m/ate/
n22http://commons.wikimedia.org/wiki/Special:FilePath/
rdfhttp://www.w3.org/1999/02/22-rdf-syntax-ns#
owlhttp://www.w3.org/2002/07/owl#
dbpedia-ithttp://it.dbpedia.org/resource/
n18https://web.archive.org/web/20070927195033/http:/wps2a.semi.org/wps/portal/_pagr/115/_pa.115/
dbpedia-zhhttp://zh.dbpedia.org/resource/
wikipedia-enhttp://en.wikipedia.org/wiki/
dbphttp://dbpedia.org/property/
dbchttp://dbpedia.org/resource/Category:
provhttp://www.w3.org/ns/prov#
xsdhhttp://www.w3.org/2001/XMLSchema#
wikidatahttp://www.wikidata.org/entity/
dbrhttp://dbpedia.org/resource/
n21http://www.maxim-ic.com/appnotes.cfm/an_pk/4303/CMP/

Statements

Subject Item
dbr:Electronic_test_equipment
dbo:wikiPageWikiLink
dbr:Automatic_test_equipment
Subject Item
dbr:List_of_United_States_Marine_Corps_MOS
dbo:wikiPageWikiLink
dbr:Automatic_test_equipment
Subject Item
dbr:List_of_acquisitions_by_Hewlett-Packard
dbo:wikiPageWikiLink
dbr:Automatic_test_equipment
Subject Item
dbr:Memory_tester
dbo:wikiPageWikiLink
dbr:Automatic_test_equipment
Subject Item
dbr:LitePoint
dbo:wikiPageWikiLink
dbr:Automatic_test_equipment
Subject Item
dbr:DUT_board
dbo:wikiPageWikiLink
dbr:Automatic_test_equipment
Subject Item
dbr:Umtech
dbo:wikiPageWikiLink
dbr:Automatic_test_equipment
Subject Item
dbr:Verigy
dbo:wikiPageWikiLink
dbr:Automatic_test_equipment
Subject Item
dbr:Design_for_testing
dbo:wikiPageWikiLink
dbr:Automatic_test_equipment
Subject Item
dbr:Device_under_test
dbo:wikiPageWikiLink
dbr:Automatic_test_equipment
Subject Item
dbr:Eagle_Test_Systems
dbo:wikiPageWikiLink
dbr:Automatic_test_equipment
Subject Item
dbr:General_Radio
dbo:wikiPageWikiLink
dbr:Automatic_test_equipment
Subject Item
dbr:George_Chamillard
dbo:wikiPageWikiLink
dbr:Automatic_test_equipment
Subject Item
dbr:Standard_Test_Data_Format
dbo:wikiPageWikiLink
dbr:Automatic_test_equipment
Subject Item
dbr:Chroma_ATE
dbo:wikiPageWikiLink
dbr:Automatic_test_equipment
Subject Item
dbr:Elta_Systems
dbo:wikiPageWikiLink
dbr:Automatic_test_equipment
Subject Item
dbr:Credence_Systems
dbo:wikiPageWikiLink
dbr:Automatic_test_equipment
Subject Item
dbr:Computational_RAM
dbo:wikiPageWikiLink
dbr:Automatic_test_equipment
Subject Item
dbr:Automatic_Test_Equipment
dbo:wikiPageWikiLink
dbr:Automatic_test_equipment
dbo:wikiPageRedirects
dbr:Automatic_test_equipment
Subject Item
dbr:Laser_trimming
dbo:wikiPageWikiLink
dbr:Automatic_test_equipment
Subject Item
dbr:Logic_built-in_self-test
dbo:wikiPageWikiLink
dbr:Automatic_test_equipment
Subject Item
dbr:PCI_eXtensions_for_Instrumentation
dbo:wikiPageWikiLink
dbr:Automatic_test_equipment
Subject Item
dbr:Abbreviated_Test_Language_for_All_Systems
dbo:wikiPageWikiLink
dbr:Automatic_test_equipment
Subject Item
dbr:Advantest
dbo:wikiPageWikiLink
dbr:Automatic_test_equipment
Subject Item
dbr:Alex_d'Arbeloff
dbo:wikiPageWikiLink
dbr:Automatic_test_equipment
Subject Item
dbr:DFI
dbo:wikiPageWikiLink
dbr:Automatic_test_equipment
Subject Item
dbr:Nick_DeWolf
dbo:wikiPageWikiLink
dbr:Automatic_test_equipment
Subject Item
dbr:PDP-11
dbo:wikiPageWikiLink
dbr:Automatic_test_equipment
Subject Item
dbr:Diagnostic_program
dbo:wikiPageWikiLink
dbr:Automatic_test_equipment
Subject Item
dbr:Keithley_Instruments
dbo:wikiPageWikiLink
dbr:Automatic_test_equipment
Subject Item
dbr:Test_fixture
dbo:wikiPageWikiLink
dbr:Automatic_test_equipment
Subject Item
dbr:Handler
dbo:wikiPageWikiLink
dbr:Automatic_test_equipment
Subject Item
dbr:Rocky_Mountain_BASIC
dbo:wikiPageWikiLink
dbr:Automatic_test_equipment
Subject Item
dbr:Test_probe
dbo:wikiPageWikiLink
dbr:Automatic_test_equipment
Subject Item
dbr:ATE_Diagnostics
dbo:wikiPageWikiLink
dbr:Automatic_test_equipment
dbo:wikiPageRedirects
dbr:Automatic_test_equipment
Subject Item
dbr:Teradyne
dbo:wikiPageWikiLink
dbr:Automatic_test_equipment
dbo:product
dbr:Automatic_test_equipment
Subject Item
dbr:Probe_card
dbo:wikiPageWikiLink
dbr:Automatic_test_equipment
Subject Item
dbr:Astronics_Corporation
dbo:wikiPageWikiLink
dbr:Automatic_test_equipment
Subject Item
dbr:System_testing
dbo:wikiPageWikiLink
dbr:Automatic_test_equipment
Subject Item
dbr:Test_equipment
dbo:wikiPageWikiLink
dbr:Automatic_test_equipment
Subject Item
dbr:Automated_tissue_image_analysis
dbo:wikiPageWikiLink
dbr:Automatic_test_equipment
Subject Item
dbr:Automatic_test_equipment
rdf:type
yago:Cognition100023271 yago:Content105809192 yago:WikicatElectricalComponents yago:Idea105833840 owl:Thing yago:Component105868954 yago:PsychologicalFeature100023100 yago:Part105867413 yago:Concept105835747 yago:Abstraction100002137
rdfs:label
自动测试设备 Automatic Test Equipment Automatic test equipment Sistema di collaudo automatico
rdfs:comment
Automatic test equipment or automated test equipment (ATE) is any apparatus that performs tests on a device, known as the device under test (DUT), equipment under test (EUT) or unit under test (UUT), using automation to quickly perform measurements and evaluate the test results. An ATE can be a simple computer-controlled digital multimeter, or a complicated system containing dozens of complex test instruments (real or simulated electronic test equipment) capable of automatically testing and diagnosing faults in sophisticated electronic packaged parts or on wafer testing, including system on chips and integrated circuits. I sistemi di collaudo automatico, comunemente definiti con l'acronimo inglese ATE (Automatic Test Equipment), sono tutti quei dispositivi o sistemi, usati per collaudare schede a circuito stampato, circuiti integrati, o qualsiasi altro componente o modulo elettronico correlato. In molti casi è costituito da una vera e propria stazione di lavoro automatica, installata alla fine della linea di produzione, preposta al collaudo del prodotto finito, ad esempio un televisore o un computer. Automatic Test Equipment (ATE) ist ein allgemeiner Begriff für messtechnische Apparaturen, die von der Chip- und Elektronik-Industrie während der Produktion zum Testen benutzt werden.Getestet werden beispielsweise * Integrierte Schaltungen im Wafer- oder Chip- und Modul-Test * Analoge Bauteile im eingelöteten Zustand * Leiterplatten ATEs führen folgende Tests durch: 自動測試設備(Automatic test equipment)簡稱ATE,是指可以利用自動化技術,針對產品進行快速測試的設備,被測試的產品會稱為被测器件(DUT)。簡單的自動測試設備可能只包括電腦控制的萬用表,也可能是包括許多複雜測試設備(實體或是仿真的电子测试设备),其目的是針對複雜的電子產品進行自動化測器以及故障診斷。自動測試設備也可以測試複雜的電子半導體封裝,或進行,待測器件可以是单片系统及集成电路。
foaf:depiction
n22:Keithley-model4200-CVU.jpg
dct:subject
dbc:Hardware_testing dbc:Automatic_test_equipment dbc:Nondestructive_testing dbc:Electronic_test_equipment
dbo:wikiPageID
1430450
dbo:wikiPageRevisionID
1116365202
dbo:wikiPageWikiLink
dbr:Semiconductor_device dbr:Packaged_part dbr:Multimeter dbr:Mass_interconnect dbr:System_on_chip dbr:Electronic_test_equipment dbr:Java_(programming_language) dbr:Ammeter dbr:Automation dbr:PXI dbr:Institute_of_Electrical_and_Electronics_Engineers dbr:National_Instruments dbr:Smalltalk dbr:Flying_probe dbr:Test_automation dbr:Python_(programming_language) n15:Keithley-model4200-CVU.jpg dbr:GPIB dbr:Jack_(connector) dbc:Hardware_testing dbr:Resistor dbr:Plug_&_Play dbr:VMEbus dbr:Computer dbr:Relay dbr:IEEE-488 dbr:Silicon_wafer dbc:Automatic_test_equipment dbr:VXI dbr:Integrated_circuit dbr:Wafer_testing dbr:19-inch_rack dbr:M-Module dbr:Boundary_scan dbr:RS-232 dbr:Analog_signature_analysis dbr:Abbreviated_Test_Language_for_All_Systems dbr:C++ dbr:Wafer_prober dbc:Nondestructive_testing dbr:Printed_circuit_board dbr:Device_under_test dbr:LabVIEW dbr:Application_programming_interface dbr:Probe_card dbr:USB dbr:Standard_Test_Data_Format dbr:C_(programming_language) dbr:Capacitor dbr:Industrial_PC dbr:Inductor dbr:Test_execution_engine dbr:Rack_unit dbr:Automatic_test_pattern_generation dbc:Electronic_test_equipment dbr:Avionics dbr:Automatic_test_switching dbr:LAN_eXtensions_for_Instrumentation
dbo:wikiPageExternalLink
n12:technical-literature.html n14:automatic-test-equipment-basics.php n18:274%3FdFormat=application%2Fmsword&docName=P038947 n21:ELK9 n26:ab48_11.pdf
owl:sameAs
freebase:m.050y3f n13:3MRZa dbpedia-it:Sistema_di_collaudo_automatico dbpedia-de:Automatic_Test_Equipment wikidata:Q363815 dbpedia-zh:自动测试设备
dbp:wikiPageUsesTemplate
dbt:Authority_control dbt:Div_col dbt:Div_col_end dbt:Short_description dbt:Reflist
dbo:thumbnail
n22:Keithley-model4200-CVU.jpg?width=300
dbo:abstract
Automatic test equipment or automated test equipment (ATE) is any apparatus that performs tests on a device, known as the device under test (DUT), equipment under test (EUT) or unit under test (UUT), using automation to quickly perform measurements and evaluate the test results. An ATE can be a simple computer-controlled digital multimeter, or a complicated system containing dozens of complex test instruments (real or simulated electronic test equipment) capable of automatically testing and diagnosing faults in sophisticated electronic packaged parts or on wafer testing, including system on chips and integrated circuits. Automatic Test Equipment (ATE) ist ein allgemeiner Begriff für messtechnische Apparaturen, die von der Chip- und Elektronik-Industrie während der Produktion zum Testen benutzt werden.Getestet werden beispielsweise * Integrierte Schaltungen im Wafer- oder Chip- und Modul-Test * Analoge Bauteile im eingelöteten Zustand * Leiterplatten ATEs führen folgende Tests durch: * Marginales Testen, beispielsweise ob der Baustein beim Anlegen von elektrischen Signalen in irgendeiner Weise reagiert, Kontakttest * Parametertest: Messen von Parametern wie Widerstand, Kapazität, Durchlassspannung, Leckstrom, minimale Versorgungsspannung, Geschwindigkeit versus Versorgungsspannung, maximal erreichbare Geschwindigkeit * Funktionstest: Messen der kompletten Funktion des Bausteins (logische Operationen, Schreiben und Lesen von Speicherchips) I sistemi di collaudo automatico, comunemente definiti con l'acronimo inglese ATE (Automatic Test Equipment), sono tutti quei dispositivi o sistemi, usati per collaudare schede a circuito stampato, circuiti integrati, o qualsiasi altro componente o modulo elettronico correlato. In molti casi è costituito da una vera e propria stazione di lavoro automatica, installata alla fine della linea di produzione, preposta al collaudo del prodotto finito, ad esempio un televisore o un computer. I dispositivi ATE possono essere controllati da PC o PLC tramite appositi software di gestione e i risultati di collaudo archiviati in database per l'analisi del controllo qualità. 自動測試設備(Automatic test equipment)簡稱ATE,是指可以利用自動化技術,針對產品進行快速測試的設備,被測試的產品會稱為被测器件(DUT)。簡單的自動測試設備可能只包括電腦控制的萬用表,也可能是包括許多複雜測試設備(實體或是仿真的电子测试设备),其目的是針對複雜的電子產品進行自動化測器以及故障診斷。自動測試設備也可以測試複雜的電子半導體封裝,或進行,待測器件可以是单片系统及集成电路。
prov:wasDerivedFrom
wikipedia-en:Automatic_test_equipment?oldid=1116365202&ns=0
dbo:wikiPageLength
22067
foaf:isPrimaryTopicOf
wikipedia-en:Automatic_test_equipment
Subject Item
dbr:Automatic_test_pattern_generation
dbo:wikiPageWikiLink
dbr:Automatic_test_equipment
Subject Item
dbr:Pogo_pin
dbo:wikiPageWikiLink
dbr:Automatic_test_equipment
Subject Item
dbr:Circuit_Check
dbo:wikiPageWikiLink
dbr:Automatic_test_equipment
dbp:products
dbr:Automatic_test_equipment
dbo:product
dbr:Automatic_test_equipment
Subject Item
dbr:Indra_Sistemas
dbo:wikiPageWikiLink
dbr:Automatic_test_equipment
Subject Item
dbr:Ate
dbo:wikiPageWikiLink
dbr:Automatic_test_equipment
dbo:wikiPageDisambiguates
dbr:Automatic_test_equipment
Subject Item
dbr:Reed_relay
dbo:wikiPageWikiLink
dbr:Automatic_test_equipment
Subject Item
dbr:Marconi_Instruments
dbo:wikiPageWikiLink
dbr:Automatic_test_equipment
Subject Item
dbr:Source_measure_unit
dbo:wikiPageWikiLink
dbr:Automatic_test_equipment
Subject Item
dbr:Shmoo_plot
dbo:wikiPageWikiLink
dbr:Automatic_test_equipment
Subject Item
dbr:Waveform_viewer
dbo:wikiPageWikiLink
dbr:Automatic_test_equipment
Subject Item
dbr:In-system_programming
dbo:wikiPageWikiLink
dbr:Automatic_test_equipment
Subject Item
dbr:Non-contact_wafer_testing
dbo:wikiPageWikiLink
dbr:Automatic_test_equipment
Subject Item
dbr:VTI_Instruments
dbo:wikiPageWikiLink
dbr:Automatic_test_equipment
Subject Item
dbr:Wafer_testing
dbo:wikiPageWikiLink
dbr:Automatic_test_equipment
Subject Item
dbr:Automated_test_equipment
dbo:wikiPageWikiLink
dbr:Automatic_test_equipment
dbo:wikiPageRedirects
dbr:Automatic_test_equipment
Subject Item
dbr:Automatic_Test_Systems
dbo:wikiPageWikiLink
dbr:Automatic_test_equipment
dbo:wikiPageRedirects
dbr:Automatic_test_equipment
Subject Item
dbr:Automatic_test_systems
dbo:wikiPageWikiLink
dbr:Automatic_test_equipment
dbo:wikiPageRedirects
dbr:Automatic_test_equipment
Subject Item
dbr:Standard_Commands_for_Programmable_Instruments
dbo:wikiPageWikiLink
dbr:Automatic_test_equipment
Subject Item
dbr:ATE_diagnostics
dbo:wikiPageWikiLink
dbr:Automatic_test_equipment
dbo:wikiPageRedirects
dbr:Automatic_test_equipment
Subject Item
dbr:Semiconductor_test_equipment
dbo:wikiPageWikiLink
dbr:Automatic_test_equipment
dbo:wikiPageRedirects
dbr:Automatic_test_equipment
Subject Item
wikipedia-en:Automatic_test_equipment
foaf:primaryTopic
dbr:Automatic_test_equipment