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Namespace Prefixes

PrefixIRI
dcthttp://purl.org/dc/terms/
dbohttp://dbpedia.org/ontology/
n10http://dbpedia.org/resource/File:
foafhttp://xmlns.com/foaf/0.1/
n16https://global.dbpedia.org/id/
dbthttp://dbpedia.org/resource/Template:
rdfshttp://www.w3.org/2000/01/rdf-schema#
n4http://commons.wikimedia.org/wiki/Special:FilePath/
rdfhttp://www.w3.org/1999/02/22-rdf-syntax-ns#
owlhttp://www.w3.org/2002/07/owl#
wikipedia-enhttp://en.wikipedia.org/wiki/
dbchttp://dbpedia.org/resource/Category:
provhttp://www.w3.org/ns/prov#
dbphttp://dbpedia.org/property/
xsdhhttp://www.w3.org/2001/XMLSchema#
wikidatahttp://www.wikidata.org/entity/
dbrhttp://dbpedia.org/resource/

Statements

Subject Item
dbr:Scanning_transmission_electron_microscopy
dbo:wikiPageWikiLink
dbr:4D_scanning_transmission_electron_microscopy
Subject Item
dbr:4D_Scanning_Transmission_Electron_Microscopy_(4D_STEM)
dbo:wikiPageWikiLink
dbr:4D_scanning_transmission_electron_microscopy
dbo:wikiPageRedirects
dbr:4D_scanning_transmission_electron_microscopy
Subject Item
dbr:4D_scanning_transmission_electron_microscopy
rdfs:label
4D scanning transmission electron microscopy
rdfs:comment
4D scanning transmission electron microscopy (4D STEM) is a subset of scanning transmission electron microscopy (STEM) which utilizes a pixelated electron detector to capture a convergent beam electron diffraction (CBED) pattern at each scan location. This technique captures a 2 dimensional reciprocal space image associated with each scan point as the beam rasters across a 2 dimensional region in real space, hence the name 4D STEM. Its development was enabled by evolution in STEM detectors and improvements computational power. The technique has applications in visual diffraction imaging, phase orientation and strain mapping, phase contrast analysis, among others.
foaf:depiction
n4:Operating_principle_in_4D_STEM.png n4:4D_STEM_with_phase_plate.png n4:Virtual_diffraction_imaging_in_4D_STEM.png
dct:subject
dbc:Electron_beam dbc:Electron_microscopy_techniques
dbo:wikiPageID
70302410
dbo:wikiPageRevisionID
1103887927
dbo:wikiPageWikiLink
dbr:Scanning_transmission_electron_microscopy dbr:Diffraction_pattern dbr:Hybrid_pixel_detector dbr:Bright-field_microscopy dbr:CBED dbr:Artificial_intelligence dbr:Crystalline dbr:Scanning_transmission_electron_microscope n10:4D_STEM_with_phase_plate.png dbr:Machine_learning n10:Operating_principle_in_4D_STEM.png dbr:Charge-coupled_device dbr:Tomography dbr:Electron_energy_loss_spectroscopy n10:Virtual_diffraction_imaging_in_4D_STEM.png dbr:Electron_beam_induced_deposition dbr:HAADF dbr:Detectors_for_transmission_electron_microscopy dbr:Kikuchi_lines_(physics) dbc:Electron_beam dbr:Metal–organic_framework dbr:Quantum_efficiency dbc:Electron_microscopy_techniques dbr:Ptychography dbr:Scanning_electron_microscope dbr:Dark-field_microscopy dbr:Amorphous_materials dbr:High-resolution_transmission_electron_microscopy dbr:Annular_dark-field_imaging dbr:Transmission_electron_microscopy dbr:Scanning_confocal_electron_microscopy dbr:Precession_electron_diffraction dbr:Semicrystalline dbr:EELS dbr:Convergent_beam_electron_diffraction dbr:Fluctuation_electron_microscopy dbr:Energy_filtered_transmission_electron_microscopy
owl:sameAs
wikidata:Q111955537 n16:GbdwS
dbp:wikiPageUsesTemplate
dbt:Proper_name dbt:Citation_needed dbt:Reflist
dbo:thumbnail
n4:Operating_principle_in_4D_STEM.png?width=300
dbo:abstract
4D scanning transmission electron microscopy (4D STEM) is a subset of scanning transmission electron microscopy (STEM) which utilizes a pixelated electron detector to capture a convergent beam electron diffraction (CBED) pattern at each scan location. This technique captures a 2 dimensional reciprocal space image associated with each scan point as the beam rasters across a 2 dimensional region in real space, hence the name 4D STEM. Its development was enabled by evolution in STEM detectors and improvements computational power. The technique has applications in visual diffraction imaging, phase orientation and strain mapping, phase contrast analysis, among others. The name 4D STEM is common in literature, however it is known by other names: 4D STEM EELS, ND STEM (N- since the number of dimensions could be higher than 4), position resolved diffraction (PRD), spatial resolved diffractometry, momentum-resolved STEM, "nanobeam precision electron diffraction", scanning electron nano diffraction, nanobeam electron diffraction, or pixelated STEM.
prov:wasDerivedFrom
wikipedia-en:4D_scanning_transmission_electron_microscopy?oldid=1103887927&ns=0
dbo:wikiPageLength
37805
foaf:isPrimaryTopicOf
wikipedia-en:4D_scanning_transmission_electron_microscopy
Subject Item
wikipedia-en:4D_scanning_transmission_electron_microscopy
foaf:primaryTopic
dbr:4D_scanning_transmission_electron_microscopy