In integrated circuit design, a critical area is a section of a circuit design wherein a particle of a particular size can cause a failure. It measures the sensitivity of the circuit to a reduction in yield. The critical area on a single layer integrated circuit design is given by: where is the area in which a defect of radius will cause a failure, and is the density function of said defect.
Property | Value |
---|---|
dbo:abstract |
|
dbo:wikiPageID |
|
dbo:wikiPageLength |
|
dbo:wikiPageRevisionID |
|
dbo:wikiPageWikiLink | |
dbp:wikiPageUsesTemplate | |
dcterms:subject | |
rdf:type | |
rdfs:comment |
|
rdfs:label |
|
owl:sameAs | |
prov:wasDerivedFrom | |
foaf:isPrimaryTopicOf | |
is dbo:wikiPageRedirects of | |
is dbo:wikiPageWikiLink of | |
is foaf:primaryTopic of |