Feature-oriented scanning (FOS) is a method of precision measurement of surface topography with a scanning probe microscope in which surface features (objects) are used as reference points for microscope probe attachment. With FOS method, by passing from one surface feature to another located nearby, the relative distance between the features and the feature neighborhood topographies are measured. This approach allows to scan an intended area of a surface by parts and then reconstruct the whole image from the obtained fragments. Beside the mentioned, it is acceptable to use another name for the method – object-oriented scanning (OOS).
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| - Feature-oriented scanning (en)
- Особенность-ориентированное сканирование (ru)
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| - Feature-oriented scanning (FOS) is a method of precision measurement of surface topography with a scanning probe microscope in which surface features (objects) are used as reference points for microscope probe attachment. With FOS method, by passing from one surface feature to another located nearby, the relative distance between the features and the feature neighborhood topographies are measured. This approach allows to scan an intended area of a surface by parts and then reconstruct the whole image from the obtained fragments. Beside the mentioned, it is acceptable to use another name for the method – object-oriented scanning (OOS). (en)
- Особенность-ориентированное сканирование (ООС, англ. FOS – feature-oriented scanning) — способ прецизионного измерения рельефа поверхности на сканирующем зондовом микроскопе, при котором особенности (объекты) поверхности служат в качестве опорных точек для привязки зонда микроскопа. В ходе ООС, переходя от одной особенности поверхности к расположенной по соседству другой особенности поверхности, производится измерение относительного расстояния между особенностями, а также измерения рельефов окрестностей этих особенностей. Описанный подход позволяет просканировать заданную область на поверхности по частям, после чего восстановить целое изображение из полученных фрагментов. Кроме указанного допустимо использование другого названия метода – объектно-ориентированное сканирование. (ru)
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| - http://www.electronics.ru/journal/article/4748
- http://www.lapshin.fast-page.org/publications/R.%20V.%20Lapshin,%20Drift-insensitive%20distributed%20calibration%20of%20probe%20microscope%20scanner%20in%20nanometer%20range%20Approach%20description.pdf%7Cbibcode=2015ApSS..359..629L%7Carxiv=1501.05545%7Cs2cid=118434225
- http://www.lapshin.fast-page.org/publications/R.%20V.%20Lapshin,%20Automatic%20drift%20elimination%20in%20probe%20microscope%20images%20based%20on%20techniques%20of%20counter-scanning%20and%20topography%20feature%20recognition.pdf%7Cbibcode=2007MeScT..18..907L
- http://www.lapshin.fast-page.org/publications/R.%20V.%20Lapshin,%20Automatic%20drift%20elimination%20in%20probe%20microscope%20images%20based%20on%20techniques%20of%20counter-scanning%20and%20topography%20feature%20recognition.ru.pdf
- http://www.lapshin.fast-page.org/publications/R.%20V.%20Lapshin,%20Availability%20of%20feature-oriented%20scanning%20probe%20microscopy%20for%20remote-controlled%20measurements%20on%20board%20a%20space%20laboratory%20or%20planet%20exploration%20rover.pdf%7Cbibcode=2009AsBio...9..437L%7Cpmid=19566423
- http://www.lapshin.fast-page.org/publications/R.%20V.%20Lapshin,%20Drift-insensitive%20distributed%20calibration%20of%20probe%20microscope%20scanner%20in%20nanometer%20range%20Virtual%20mode.pdf%7Cbibcode=2016ApSS..378..530L%7Carxiv=1501.05726%7Cs2cid=119191299
- http://www.lapshin.fast-page.org/publications/R.%20V.%20Lapshin,%20Feature-oriented%20scanning%20methodology%20for%20probe%20microscopy%20and%20nanotechnology.pdf%7Cbibcode=2004Nanot..15.1135L
- http://www.lapshin.fast-page.org/publications/R.%20V.%20Lapshin,%20Feature-oriented%20scanning%20methodology%20for%20probe%20microscopy%20and%20nanotechnology.ru.pdf
- http://www.lapshin.fast-page.org/publications/R.%20V.%20Lapshin,%20Feature-oriented%20scanning%20probe%20microscopy.pdf
- http://www.lapshin.fast-page.org/publications/R.%20V.%20Lapshin,%20Report,%20Observation%20of%20a%20hexagonal%20superstructure%20on%20pyrolytic%20graphite%20by%20method%20of%20feature-oriented%20scanning%20tunneling%20microscopy.pdf
- http://www.lapshin.fast-page.org/research.htm%23fos1996
- https://zenodo.org/record/1233907%7Cpmid=10061462
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| - Feature-oriented scanning (FOS) is a method of precision measurement of surface topography with a scanning probe microscope in which surface features (objects) are used as reference points for microscope probe attachment. With FOS method, by passing from one surface feature to another located nearby, the relative distance between the features and the feature neighborhood topographies are measured. This approach allows to scan an intended area of a surface by parts and then reconstruct the whole image from the obtained fragments. Beside the mentioned, it is acceptable to use another name for the method – object-oriented scanning (OOS). (en)
- Особенность-ориентированное сканирование (ООС, англ. FOS – feature-oriented scanning) — способ прецизионного измерения рельефа поверхности на сканирующем зондовом микроскопе, при котором особенности (объекты) поверхности служат в качестве опорных точек для привязки зонда микроскопа. В ходе ООС, переходя от одной особенности поверхности к расположенной по соседству другой особенности поверхности, производится измерение относительного расстояния между особенностями, а также измерения рельефов окрестностей этих особенностей. Описанный подход позволяет просканировать заданную область на поверхности по частям, после чего восстановить целое изображение из полученных фрагментов. Кроме указанного допустимо использование другого названия метода – объектно-ориентированное сканирование. (ru)
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