The Automotive Electronics Council (AEC) is an organization originally established in the 1990s by Chrysler, Ford, and GM for the purpose of establishing common part-qualification and quality-system standards. Most commonly referenced AEC documents are:
* AEC-Q100 "Failure Mechanism Based Stress Test Qualification For Integrated Circuits"
* AEC-Q101 "Failure Mechanism Based Stress Test Qualification For Discrete Semiconductors"
* AEC-Q200 "Stress Test Qualification For Passive Components"
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| - Automotive Electronics Council (ca)
- Automotive Electronics Council (de)
- Automotive Electronics Council (en)
- 汽車電子協會 (zh)
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| - Automotive Electronics Council (AEC, en català consell electrònic automotriu) és una organització d'estandardització del sector automotriu amb seu als EUA però amb projecció mundial. L'objectiu de l'AEC és definir uns estàndards per aconseguir que els components electrònics tinguin gran qualitat i fiabilitat. Els membres de l'AEC són fabricants de components elecrònics majoritàriament. SAE fou creat el 1993 per Chrysler, Ford Motor i Delco Electronics. (ca)
- Das Automotive Electronics Council (kurz AEC) ist eine US-amerikanische Organisation zur Standardisierung der Qualifizierung von Elektronikkomponenten in der Automobilzulieferindustrie. (de)
- 汽車電子協會（英語：Automotive Electronics Council，簡稱AEC），是在1990年由克萊思勒、福特汽車、通用汽車組成的組織，目的是要建立共用的零件承認以及品質系統標準。 AEC的零件技術委員會（Component Technical Committee）有訂定電子零件的標準，符合該標準的零件可以用在惡劣的車用環境中，不需額外的零件等級認證測試。在AEC官網上有AEC零件技術委員會的技術文件。 常用的AEC文件有：
* AEC-Q100 Failure Mechanism Based Stress Test Qualification For Integrated Circuits
* AEC-Q101 Failure Mechanism Based Stress Test Qualification For Discrete Semiconductors
* AEC-Q200 Stress Test Qualification For Passive Components (zh)
- The Automotive Electronics Council (AEC) is an organization originally established in the 1990s by Chrysler, Ford, and GM for the purpose of establishing common part-qualification and quality-system standards. Most commonly referenced AEC documents are:
* AEC-Q100 "Failure Mechanism Based Stress Test Qualification For Integrated Circuits"
* AEC-Q101 "Failure Mechanism Based Stress Test Qualification For Discrete Semiconductors"
* AEC-Q200 "Stress Test Qualification For Passive Components" (en)
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| - Automotive Electronics Council (AEC, en català consell electrònic automotriu) és una organització d'estandardització del sector automotriu amb seu als EUA però amb projecció mundial. L'objectiu de l'AEC és definir uns estàndards per aconseguir que els components electrònics tinguin gran qualitat i fiabilitat. Els membres de l'AEC són fabricants de components elecrònics majoritàriament. SAE fou creat el 1993 per Chrysler, Ford Motor i Delco Electronics. (ca)
- Das Automotive Electronics Council (kurz AEC) ist eine US-amerikanische Organisation zur Standardisierung der Qualifizierung von Elektronikkomponenten in der Automobilzulieferindustrie. (de)
- The Automotive Electronics Council (AEC) is an organization originally established in the 1990s by Chrysler, Ford, and GM for the purpose of establishing common part-qualification and quality-system standards. The AEC Component Technical Committee is the standardization body for establishing standards for reliable, high quality electronic components. Components meeting these specifications are suitable for use in the harsh automotive environment without additional component-level qualification testing. The technical documents developed by the AEC Component Technical Committee are available at the AEC web site. Most commonly referenced AEC documents are:
* AEC-Q100 "Failure Mechanism Based Stress Test Qualification For Integrated Circuits"
* AEC-Q101 "Failure Mechanism Based Stress Test Qualification For Discrete Semiconductors"
* AEC-Q200 "Stress Test Qualification For Passive Components" (en)
- 汽車電子協會（英語：Automotive Electronics Council，簡稱AEC），是在1990年由克萊思勒、福特汽車、通用汽車組成的組織，目的是要建立共用的零件承認以及品質系統標準。 AEC的零件技術委員會（Component Technical Committee）有訂定電子零件的標準，符合該標準的零件可以用在惡劣的車用環境中，不需額外的零件等級認證測試。在AEC官網上有AEC零件技術委員會的技術文件。 常用的AEC文件有：
* AEC-Q100 Failure Mechanism Based Stress Test Qualification For Integrated Circuits
* AEC-Q101 Failure Mechanism Based Stress Test Qualification For Discrete Semiconductors
* AEC-Q200 Stress Test Qualification For Passive Components (zh)
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