This HTML5 document contains 22 embedded RDF statements represented using HTML+Microdata notation.

The embedded RDF content will be recognized by any processor of HTML5 Microdata.

PrefixNamespace IRI
dcthttp://purl.org/dc/terms/
dbohttp://dbpedia.org/ontology/
foafhttp://xmlns.com/foaf/0.1/
n13http://contracts.onecle.com/brocade/solectron.mfg.1999.07.30.
dbpedia-wikidatahttp://wikidata.dbpedia.org/resource/
n16http://en.wikipedia.org/wiki/Ongoing_reliability_test?oldid=
n4http://www.opsalacarte.com/Pages/reliability/reliability_manu_ort.
rdfshttp://www.w3.org/2000/01/rdf-schema#
n12http://rdf.freebase.com/ns/m.
rdfhttp://www.w3.org/1999/02/22-rdf-syntax-ns#
owlhttp://www.w3.org/2002/07/owl#
wikipedia-enhttp://en.wikipedia.org/wiki/
n14http://purl.org/voc/vrank#
dbchttp://dbpedia.org/resource/Category:
provhttp://www.w3.org/ns/prov#
xsdhhttp://www.w3.org/2001/XMLSchema#
n8http://purl.org/linguistics/gold/
wikidatahttp://www.wikidata.org/entity/
dbrhttp://dbpedia.org/resource/
Subject Item
dbr:Ongoing_reliability_test
rdf:type
dbo:Election
rdfs:label
Ongoing reliability test
rdfs:comment
The ongoing reliability test (ORT) is a hardware test process usually used in manufacturing to ensure that quality of the products is still of the same specifications as the day it first went to production or general availability.
owl:sameAs
dbpedia-wikidata:Q7093848 wikidata:Q7093848 n12:02ppp3n
dct:subject
dbc:Quality_control dbc:Hardware_testing
dbo:wikiPageID
9704027
dbo:wikiPageRevisionID
687815312
dbo:wikiPageWikiLink
dbc:Hardware_testing dbc:Quality_control dbr:Highly_accelerated_stress_screen dbr:Manufacturing
dbo:wikiPageExternalLink
n4:htm n13:shtml
foaf:isPrimaryTopicOf
wikipedia-en:Ongoing_reliability_test
prov:wasDerivedFrom
n16:687815312
dbo:abstract
The ongoing reliability test (ORT) is a hardware test process usually used in manufacturing to ensure that quality of the products is still of the same specifications as the day it first went to production or general availability. The products currently in the manufacturing line are randomly picked every day with a predefined percentage or numbers and then put in a environmental chamber that provides the stress profile of thermal cycling, elevated temperature, or combined environmental stresses to induce fatigue damage. The profile should stimulate the precipitation of latent defects that may be introduced from the manufacturing process but not remove significant life from the product or introduce flaws to risk failure during its intended mission. highly accelerated stress test is a Ongoing Reliability Test that uses the empirical operational limits as the reference for the combined vibration, thermal cycling, and other stress applied to find latent defects. Quality of the products is then measured with the results of this test. If a unit fails, it goes under investigation to see what caused the failure and then remove the cause whether it came from an assembly process or from a component being incorrectly manufactured, or any other cause. If it is proven that a real failure occurs, the batch of units that were produced along with the failed unit, is then tagged for re-test or repair to either verify or fix the problem.
n14:hasRank
_:vb24165721
n8:hypernym
dbr:Process
Subject Item
_:vb24165721
n14:rankValue
0.325651