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Statements

Subject Item
dbr:Process_Control_Monitoring
dbo:wikiPageWikiLink
dbr:Process_control_monitoring
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dbr:Process_control_monitoring
Subject Item
dbr:PCM_(disambiguation)
dbo:wikiPageWikiLink
dbr:Process_control_monitoring
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dbr:Process_control_monitoring
Subject Item
dbr:Process_control_monitoring
rdf:type
yago:ComputerCircuit103084420 yago:IntegratedCircuit103577090 yago:PhysicalEntity100001930 yago:Instrumentality103575240 yago:Circuit103033362 dbo:AnatomicalStructure yago:Artifact100021939 yago:Whole100003553 yago:Device103183080 yago:WikicatIntegratedCircuits yago:ElectricalDevice103269401 yago:Object100002684
rdfs:label
Process control monitoring
rdfs:comment
In the application of integrated circuits, process control monitoring (PCM) is the procedure followed to obtain detailed information about the process used. PCM is associated with designing and fabricating special structures that can monitor technology specific parameters such as Vth in CMOS and Vbe in bipolars. These structures are placed across the wafer at specific locations along with the chip produced so that a closer look into the process variation is possible. * v * t * e
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dbc:Integrated_circuits
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14586564
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688165480
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dbr:CMOS dbc:Integrated_circuits dbr:Integrated_circuits
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In the application of integrated circuits, process control monitoring (PCM) is the procedure followed to obtain detailed information about the process used. PCM is associated with designing and fabricating special structures that can monitor technology specific parameters such as Vth in CMOS and Vbe in bipolars. These structures are placed across the wafer at specific locations along with the chip produced so that a closer look into the process variation is possible. * v * t * e
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dbr:Procedure
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wikipedia-en:Process_control_monitoring?oldid=688165480&ns=0
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595
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wikipedia-en:Process_control_monitoring
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dbr:Process_control
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dbr:Process_control_monitoring
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wikipedia-en:Process_control_monitoring
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dbr:Process_control_monitoring