This HTML5 document contains 50 embedded RDF statements represented using HTML+Microdata notation.

The embedded RDF content will be recognized by any processor of HTML5 Microdata.

Namespace Prefixes

PrefixIRI
dcthttp://purl.org/dc/terms/
yago-reshttp://yago-knowledge.org/resource/
n4http://www.siliconfareast.com/
dbohttp://dbpedia.org/ontology/
n17http://www.eventhelix.com/RealtimeMantra/FaultHandling/
foafhttp://xmlns.com/foaf/0.1/
n8https://global.dbpedia.org/id/
yagohttp://dbpedia.org/class/yago/
dbthttp://dbpedia.org/resource/Template:
rdfshttp://www.w3.org/2000/01/rdf-schema#
freebasehttp://rdf.freebase.com/ns/
rdfhttp://www.w3.org/1999/02/22-rdf-syntax-ns#
owlhttp://www.w3.org/2002/07/owl#
n16http://www.analog.com/library/analogDialogue/archives/42-02/
wikipedia-enhttp://en.wikipedia.org/wiki/
dbchttp://dbpedia.org/resource/Category:
provhttp://www.w3.org/ns/prov#
dbphttp://dbpedia.org/property/
xsdhhttp://www.w3.org/2001/XMLSchema#
goldhttp://purl.org/linguistics/gold/
wikidatahttp://www.wikidata.org/entity/
dbrhttp://dbpedia.org/resource/

Statements

Subject Item
dbr:Logic_built-in_self-test
rdf:type
yago:Whole100003553 yago:Object100002684 yago:Device103183080 yago:ComputerCircuit103084420 yago:Instrumentality103575240 yago:WikicatIntegratedCircuits yago:PhysicalEntity100001930 yago:Circuit103033362 yago:ElectricalDevice103269401 yago:Artifact100021939 yago:IntegratedCircuit103577090
rdfs:label
Logic built-in self-test
rdfs:comment
Logic built-in self-test (or LBIST) is a form of built-in self-test (BIST) in which hardware and/or software is built into integrated circuits allowing them to test their own operation, as opposed to reliance on external automated test equipment.
dct:subject
dbc:Integrated_circuits
dbo:wikiPageID
20756379
dbo:wikiPageRevisionID
930289407
dbo:wikiPageWikiLink
dbr:Memory dbr:Power-on_self-test dbr:Built-in_self-test dbr:Built-in_test_equipment dbr:Read-only_memory dbc:Integrated_circuits dbr:Automatic_test_equipment dbr:Analogue_electronics dbr:Programmable_logic_device dbr:Design_for_test dbr:Integrated_circuit dbr:MBIST dbr:Array_data_structure dbr:Flash_memory
dbo:wikiPageExternalLink
n4:bist.htm n16:bist.html n17:hardware_diagnostics.htm
owl:sameAs
n8:4qtAF wikidata:Q6667452 freebase:m.052_5c7 yago-res:Logic_built-in_self-test
dbp:wikiPageUsesTemplate
dbt:Cite_web
dbo:abstract
Logic built-in self-test (or LBIST) is a form of built-in self-test (BIST) in which hardware and/or software is built into integrated circuits allowing them to test their own operation, as opposed to reliance on external automated test equipment.
gold:hypernym
dbr:Form
prov:wasDerivedFrom
wikipedia-en:Logic_built-in_self-test?oldid=930289407&ns=0
dbo:wikiPageLength
2392
foaf:isPrimaryTopicOf
wikipedia-en:Logic_built-in_self-test
Subject Item
dbr:High-temperature_operating_life
dbo:wikiPageWikiLink
dbr:Logic_built-in_self-test
Subject Item
dbr:Built-in_self-test
dbo:wikiPageWikiLink
dbr:Logic_built-in_self-test
Subject Item
dbr:Built-in_test_equipment
dbo:wikiPageWikiLink
dbr:Logic_built-in_self-test
Subject Item
dbr:Software_fault_tolerance
dbo:wikiPageWikiLink
dbr:Logic_built-in_self-test
Subject Item
dbr:LBIST
dbo:wikiPageWikiLink
dbr:Logic_built-in_self-test
dbo:wikiPageRedirects
dbr:Logic_built-in_self-test
Subject Item
wikipedia-en:Logic_built-in_self-test
foaf:primaryTopic
dbr:Logic_built-in_self-test