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Statements

Subject Item
dbr:4D_scanning_transmission_electron_microscopy
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dbr:Fluctuation_electron_microscopy
Subject Item
dbr:Fluctuation_electron_microscopy
rdfs:label
Fluctuation electron microscopy
rdfs:comment
Fluctuation electron microscopy (FEM), originally called Variable Coherence Microscopy before decoherence effects in the sample rendered that naming moot, is a technique in electron microscopy that probes nanometer-scale or "medium-range" order in disordered materials. The first studies were performed on amorphous Si (Treacy and Gibson 1997) and later on hydrogenated amorphous silicon.
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dbc:Electron_microscopy
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52885568
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1039625726
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Fluctuation electron microscopy (FEM), originally called Variable Coherence Microscopy before decoherence effects in the sample rendered that naming moot, is a technique in electron microscopy that probes nanometer-scale or "medium-range" order in disordered materials. The first studies were performed on amorphous Si (Treacy and Gibson 1997) and later on hydrogenated amorphous silicon.
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dbr:Paracrystallinity
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