This HTML5 document contains 36 embedded RDF statements represented using HTML+Microdata notation.

The embedded RDF content will be recognized by any processor of HTML5 Microdata.

Namespace Prefixes

PrefixIRI
dcthttp://purl.org/dc/terms/
dbohttp://dbpedia.org/ontology/
foafhttp://xmlns.com/foaf/0.1/
dbpedia-eshttp://es.dbpedia.org/resource/
n17https://global.dbpedia.org/id/
dbthttp://dbpedia.org/resource/Template:
rdfshttp://www.w3.org/2000/01/rdf-schema#
freebasehttp://rdf.freebase.com/ns/
rdfhttp://www.w3.org/1999/02/22-rdf-syntax-ns#
owlhttp://www.w3.org/2002/07/owl#
wikipedia-enhttp://en.wikipedia.org/wiki/
dbphttp://dbpedia.org/property/
dbchttp://dbpedia.org/resource/Category:
provhttp://www.w3.org/ns/prov#
xsdhhttp://www.w3.org/2001/XMLSchema#
wikidatahttp://www.wikidata.org/entity/
goldhttp://purl.org/linguistics/gold/
dbrhttp://dbpedia.org/resource/

Statements

Subject Item
dbr:Correlated_double_sampling
rdf:type
dbo:Software
rdfs:label
Muestreo doble correlacionado Correlated double sampling
rdfs:comment
Correlated double sampling (CDS) is a method to measure electrical values such as voltages or currents that allows removing an undesired offset. It is used often when measuring sensor outputs. The output of the sensor is measured twice: once in a known condition and once in an unknown condition. The value measured from the known condition is then subtracted from the unknown condition to generate a value with a known relation to the physical quantity being measured. El muestreo doble correlacionado es una técnica empleada para la medición de señales eléctricas tales como tensiones o corrientes, que permite la eliminación de desplazamientos indeseados de CC (DC offset). Esta técnica es usada frecuentemente en la medición de datos de salida de los sensores electrónicos. La salida del sensor es medida dos veces: la primera vez se mide operando en condiciones conocidas, y la segunda vez, es medida operando en condiciones desconocidas. El valor medido en condiciones conocidas se resta del valor medido en condiciones desconocidas, generando de esta forma una relación conocida con la cantidad física que está siendo medida.
dct:subject
dbc:Measurement dbc:Electricity
dbo:wikiPageID
20153971
dbo:wikiPageRevisionID
890179656
dbo:wikiPageWikiLink
dbr:Switched-capacitor dbr:Electric_current dbr:Voltage dbc:Electricity dbr:Nyquist_noise dbr:Dark-frame_subtraction dbc:Measurement
owl:sameAs
freebase:m.04ygfwn wikidata:Q5172837 dbpedia-es:Muestreo_doble_correlacionado n17:4iNhU
dbp:wikiPageUsesTemplate
dbt:Electronics-stub dbt:Reflist
dbo:abstract
El muestreo doble correlacionado es una técnica empleada para la medición de señales eléctricas tales como tensiones o corrientes, que permite la eliminación de desplazamientos indeseados de CC (DC offset). Esta técnica es usada frecuentemente en la medición de datos de salida de los sensores electrónicos. La salida del sensor es medida dos veces: la primera vez se mide operando en condiciones conocidas, y la segunda vez, es medida operando en condiciones desconocidas. El valor medido en condiciones conocidas se resta del valor medido en condiciones desconocidas, generando de esta forma una relación conocida con la cantidad física que está siendo medida. * Datos: Q5172837 Correlated double sampling (CDS) is a method to measure electrical values such as voltages or currents that allows removing an undesired offset. It is used often when measuring sensor outputs. The output of the sensor is measured twice: once in a known condition and once in an unknown condition. The value measured from the known condition is then subtracted from the unknown condition to generate a value with a known relation to the physical quantity being measured. This is commonly used in switched-capacitor operational amplifiers to effectively double the gain of the charge sharing opamp, while adding an extra phase. When used in imagers, correlated double sampling is a noise reduction technique in which the reference voltage of the pixel (i.e., the pixel’s voltage after it is reset) is subtracted from the signal voltage of the pixel (i.e., the pixel’s voltage at the end of integration) at the end of each integration period, to cancel kTC noise (the thermal noise associated with the sensor's capacitance).
gold:hypernym
dbr:Method
prov:wasDerivedFrom
wikipedia-en:Correlated_double_sampling?oldid=890179656&ns=0
dbo:wikiPageLength
1418
foaf:isPrimaryTopicOf
wikipedia-en:Correlated_double_sampling
Subject Item
dbr:Active-pixel_sensor
dbo:wikiPageWikiLink
dbr:Correlated_double_sampling
Subject Item
dbr:Correlated_Double_Sampling
dbo:wikiPageWikiLink
dbr:Correlated_double_sampling
dbo:wikiPageRedirects
dbr:Correlated_double_sampling
Subject Item
dbr:CDS
dbo:wikiPageWikiLink
dbr:Correlated_double_sampling
dbo:wikiPageDisambiguates
dbr:Correlated_double_sampling
Subject Item
dbr:Image_sensor
dbo:wikiPageWikiLink
dbr:Correlated_double_sampling
Subject Item
dbr:Fixed-pattern_noise
dbo:wikiPageWikiLink
dbr:Correlated_double_sampling
Subject Item
wikipedia-en:Correlated_double_sampling
foaf:primaryTopic
dbr:Correlated_double_sampling