Photothermal microspectroscopy (PTMS), alternatively known as photothermal temperature fluctuation (PTTF), is derived from two parent instrumental techniques: infrared spectroscopy and atomic force microscopy (AFM). In one particular type of AFM, known as scanning thermal microscopy (SThM), the imaging probe is a sub-miniature temperature sensor, which may be a thermocouple or a resistance thermometer. This same type of detector is employed in a PTMS instrument, enabling it to provide AFM/SThM images: However, the chief additional use of PTMS is to yield infrared spectra from sample regions below a micrometer, as outlined below.
Property | Value |
---|---|
dbo:abstract |
|
dbo:wikiPageExternalLink |
|
dbo:wikiPageID |
|
dbo:wikiPageLength |
|
dbo:wikiPageRevisionID |
|
dbo:wikiPageWikiLink | |
dbp:wikiPageUsesTemplate | |
dcterms:subject | |
rdfs:comment |
|
rdfs:label |
|
owl:sameAs | |
prov:wasDerivedFrom | |
foaf:isPrimaryTopicOf | |
is dbo:wikiPageRedirects of | |
is dbo:wikiPageWikiLink of |
|
is foaf:primaryTopic of |