{
  "http://en.wikipedia.org/wiki/Reliability_(semiconductor)" : { "http://xmlns.com/foaf/0.1/primaryTopic" : [ { "type" : "uri", "value" : "http://dbpedia.org/resource/Reliability_(semiconductor)" } ] } ,
  "http://dbpedia.org/resource/Chenming_Hu" : { "http://dbpedia.org/ontology/wikiPageWikiLink" : [ { "type" : "uri", "value" : "http://dbpedia.org/resource/Reliability_(semiconductor)" } ] } ,
  "http://dbpedia.org/resource/Robert_F._Smith_(investor)" : { "http://dbpedia.org/ontology/wikiPageWikiLink" : [ { "type" : "uri", "value" : "http://dbpedia.org/resource/Reliability_(semiconductor)" } ] } ,
  "http://dbpedia.org/resource/High-temperature_operating_life" : { "http://dbpedia.org/ontology/wikiPageWikiLink" : [ { "type" : "uri", "value" : "http://dbpedia.org/resource/Reliability_(semiconductor)" } ] } ,
  "http://dbpedia.org/resource/Glass_frit_bonding" : { "http://dbpedia.org/ontology/wikiPageWikiLink" : [ { "type" : "uri", "value" : "http://dbpedia.org/resource/Reliability_(semiconductor)" } ] } ,
  "http://dbpedia.org/resource/System_on_a_chip" : { "http://dbpedia.org/ontology/wikiPageWikiLink" : [ { "type" : "uri", "value" : "http://dbpedia.org/resource/Reliability_(semiconductor)" } ] } ,
  "http://dbpedia.org/resource/Hot-carrier_injection" : { "http://dbpedia.org/ontology/wikiPageWikiLink" : [ { "type" : "uri", "value" : "http://dbpedia.org/resource/Reliability_(semiconductor)" } ] } ,
  "http://dbpedia.org/resource/QBD_(electronics)" : { "http://dbpedia.org/ontology/wikiPageWikiLink" : [ { "type" : "uri", "value" : "http://dbpedia.org/resource/Reliability_(semiconductor)" } ] } ,
  "http://dbpedia.org/resource/DO-160" : { "http://dbpedia.org/ontology/wikiPageWikiLink" : [ { "type" : "uri", "value" : "http://dbpedia.org/resource/Reliability_(semiconductor)" } ] } ,
  "http://dbpedia.org/resource/MOSFET" : { "http://dbpedia.org/ontology/wikiPageWikiLink" : [ { "type" : "uri", "value" : "http://dbpedia.org/resource/Reliability_(semiconductor)" } ] } ,
  "http://dbpedia.org/resource/Semiconductor_device" : { "http://dbpedia.org/ontology/wikiPageWikiLink" : [ { "type" : "uri", "value" : "http://dbpedia.org/resource/Reliability_(semiconductor)" } ] } ,
  "http://dbpedia.org/resource/Reliability_(semiconductor)" : { "http://www.w3.org/2002/07/owl#sameAs" : [ { "type" : "uri", "value" : "http://ca.dbpedia.org/resource/Fiabilitat_(semiconductors)" } ,
      { "type" : "uri", "value" : "http://www.wikidata.org/entity/Q7310987" } ,
      { "type" : "uri", "value" : "http://rdf.freebase.com/ns/m.051xsx7" } ,
      { "type" : "uri", "value" : "http://zh.dbpedia.org/resource/\u534A\u5BFC\u4F53\u5668\u4EF6\u53EF\u9760\u6027" } ,
      { "type" : "uri", "value" : "http://dbpedia.org/resource/Reliability_(semiconductor)" } ,
      { "type" : "uri", "value" : "https://global.dbpedia.org/id/4tSwd" } ] ,
    "http://www.w3.org/2000/01/rdf-schema#label" : [ { "type" : "literal", "value" : "\u534A\u5BFC\u4F53\u5668\u4EF6\u53EF\u9760\u6027" , "lang" : "zh" } ,
      { "type" : "literal", "value" : "Reliability (semiconductor)" , "lang" : "en" } ,
      { "type" : "literal", "value" : "Fiabilitat (semiconductors)" , "lang" : "ca" } ] ,
    "http://purl.org/dc/terms/subject" : [ { "type" : "uri", "value" : "http://dbpedia.org/resource/Category:Semiconductor_device_fabrication" } ] ,
    "http://www.w3.org/ns/prov#wasDerivedFrom" : [ { "type" : "uri", "value" : "http://en.wikipedia.org/wiki/Reliability_(semiconductor)?oldid=1309330013&ns=0" } ] ,
    "http://xmlns.com/foaf/0.1/isPrimaryTopicOf" : [ { "type" : "uri", "value" : "http://en.wikipedia.org/wiki/Reliability_(semiconductor)" } ] ,
    "http://dbpedia.org/ontology/wikiPageWikiLink" : [ { "type" : "uri", "value" : "http://dbpedia.org/resource/Dust" } ,
      { "type" : "uri", "value" : "http://dbpedia.org/resource/Process_control" } ,
      { "type" : "uri", "value" : "http://dbpedia.org/resource/Vibration" } ,
      { "type" : "uri", "value" : "http://dbpedia.org/resource/Metastability" } ,
      { "type" : "uri", "value" : "http://dbpedia.org/resource/Shock_(mechanics)" } ,
      { "type" : "uri", "value" : "http://dbpedia.org/resource/List_of_materials-testing_resources" } ,
      { "type" : "uri", "value" : "http://dbpedia.org/resource/Field-effect_transistor" } ,
      { "type" : "uri", "value" : "http://dbpedia.org/resource/Pressure" } ,
      { "type" : "uri", "value" : "http://dbpedia.org/resource/Latch-up" } ,
      { "type" : "uri", "value" : "http://dbpedia.org/resource/Voltage" } ,
      { "type" : "uri", "value" : "http://dbpedia.org/resource/Electric_power" } ,
      { "type" : "uri", "value" : "http://dbpedia.org/resource/Time_to_market" } ,
      { "type" : "uri", "value" : "http://dbpedia.org/resource/Wire_bonding" } ,
      { "type" : "uri", "value" : "http://dbpedia.org/resource/Thin_films" } ,
      { "type" : "uri", "value" : "http://dbpedia.org/resource/Wafer_prober" } ,
      { "type" : "uri", "value" : "http://dbpedia.org/resource/Overcurrent" } ,
      { "type" : "uri", "value" : "http://dbpedia.org/resource/Economy_of_scale" } ,
      { "type" : "uri", "value" : "http://dbpedia.org/resource/Timing_analysis" } ,
      { "type" : "uri", "value" : "http://dbpedia.org/resource/Metallizing" } ,
      { "type" : "uri", "value" : "http://dbpedia.org/resource/Temperature" } ,
      { "type" : "uri", "value" : "http://dbpedia.org/resource/Category:Semiconductor_device_fabrication" } ,
      { "type" : "uri", "value" : "http://dbpedia.org/resource/Transistor_aging" } ,
      { "type" : "uri", "value" : "http://dbpedia.org/resource/Electric_current" } ,
      { "type" : "uri", "value" : "http://dbpedia.org/resource/Logic_simulation" } ,
      { "type" : "uri", "value" : "http://dbpedia.org/resource/Humidity" } ,
      { "type" : "uri", "value" : "http://dbpedia.org/resource/Electrical" } ,
      { "type" : "uri", "value" : "http://dbpedia.org/resource/Overvoltage" } ,
      { "type" : "uri", "value" : "http://dbpedia.org/resource/Semiconductor" } ,
      { "type" : "uri", "value" : "http://dbpedia.org/resource/Cleanrooms" } ,
      { "type" : "uri", "value" : "http://dbpedia.org/resource/Magnetic" } ,
      { "type" : "uri", "value" : "http://dbpedia.org/resource/Cleanroom" } ,
      { "type" : "uri", "value" : "http://dbpedia.org/resource/Electromigration" } ,
      { "type" : "uri", "value" : "http://dbpedia.org/resource/Fracture" } ,
      { "type" : "uri", "value" : "http://dbpedia.org/resource/List_of_semiconductor_materials" } ,
      { "type" : "uri", "value" : "http://dbpedia.org/resource/Ohmic_contact" } ,
      { "type" : "uri", "value" : "http://dbpedia.org/resource/Failure_analysis" } ,
      { "type" : "uri", "value" : "http://dbpedia.org/resource/Gas" } ,
      { "type" : "uri", "value" : "http://dbpedia.org/resource/Radiation" } ,
      { "type" : "uri", "value" : "http://dbpedia.org/resource/Non-recurring_engineering" } ,
      { "type" : "uri", "value" : "http://dbpedia.org/resource/HIRF" } ,
      { "type" : "uri", "value" : "http://dbpedia.org/resource/Electrostatic_discharge" } ,
      { "type" : "uri", "value" : "http://dbpedia.org/resource/Injection_molding" } ,
      { "type" : "uri", "value" : "http://dbpedia.org/resource/Automotive_Electronics_Council" } ,
      { "type" : "uri", "value" : "http://dbpedia.org/resource/Mechanical_stress" } ,
      { "type" : "uri", "value" : "http://dbpedia.org/resource/Burn-in" } ,
      { "type" : "uri", "value" : "http://dbpedia.org/resource/Final_test" } ,
      { "type" : "uri", "value" : "http://dbpedia.org/resource/List_of_materials_analysis_methods" } ,
      { "type" : "uri", "value" : "http://dbpedia.org/resource/Derating" } ] ,
    "http://dbpedia.org/ontology/description" : [ { "type" : "literal", "value" : "\u062A\u0648\u0627\u0646\u0627\u06CC\u06CC \u0627\u0641\u0632\u0627\u0631\u0647 \u0628\u0631\u0627\u06CC \u0627\u0646\u062C\u0627\u0645 \u06A9\u0627\u0631\u06A9\u0631\u062F \u0645\u0648\u0631\u062F \u0646\u0638\u0631 \u062E\u0648\u062F \u062F\u0631 \u0637\u0648\u0644\u200C\u0639\u0645\u0631 \u0627\u0641\u0632\u0627\u0631\u0647 \u062F\u0631 \u0635\u062D\u0646\u0647 \u0639\u0645\u0644 \u0627\u0633\u062A" , "lang" : "fa" } ,
      { "type" : "literal", "value" : "reliability of semiconductor-based electronic components" , "lang" : "en" } ,
      { "type" : "literal", "value" : "es pot relacionar amb la corba de la taxa de fallada anomenada: corba de la banyera." , "lang" : "ca" } ] ,
    "http://dbpedia.org/property/wikiPageUsesTemplate" : [ { "type" : "uri", "value" : "http://dbpedia.org/resource/Template:Multiple_issues" } ,
      { "type" : "uri", "value" : "http://dbpedia.org/resource/Template:Dead_link" } ,
      { "type" : "uri", "value" : "http://dbpedia.org/resource/Template:Cite_journal" } ,
      { "type" : "uri", "value" : "http://dbpedia.org/resource/Template:Cite_book" } ,
      { "type" : "uri", "value" : "http://dbpedia.org/resource/Template:Lead_rewrite" } ,
      { "type" : "uri", "value" : "http://dbpedia.org/resource/Template:Full" } ,
      { "type" : "uri", "value" : "http://dbpedia.org/resource/Template:Reflist" } ,
      { "type" : "uri", "value" : "http://dbpedia.org/resource/Template:Citation" } ,
      { "type" : "uri", "value" : "http://dbpedia.org/resource/Template:Cite_web" } ,
      { "type" : "uri", "value" : "http://dbpedia.org/resource/Template:Technical" } ] ,
    "http://dbpedia.org/property/date" : [ { "type" : "literal", "value" : "September 2025" , "lang" : "en" } ] ,
    "http://dbpedia.org/ontology/wikiPageExternalLink" : [ { "type" : "uri", "value" : "http://parts.jpl.nasa.gov/mmic/4.PDF" } ,
      { "type" : "uri", "value" : "https://vbn.aau.dk/da/publications/81f0ae92-f0e2-4608-88a7-6a7c17ae8375" } ,
      { "type" : "uri", "value" : "https://web.archive.org/web/20051108142529/http:/www.enre.umd.edu/publications/rs&h.htm" } ,
      { "type" : "uri", "value" : "http://www.enre.umd.edu/publications/rs&h.htm" } ,
      { "type" : "uri", "value" : "http://documentation.renesas.com/eng/products/others/rej27l0001_reliabilityhb.pdf" } ,
      { "type" : "uri", "value" : "https://web.archive.org/web/20061201114214/http:/documentation.renesas.com/eng/products/others/rej27l0001_reliabilityhb.pdf" } ] ,
    "http://dbpedia.org/property/bot" : [ { "type" : "literal", "value" : "InternetArchiveBot" , "lang" : "en" } ] ,
    "http://dbpedia.org/property/fixAttempted" : [ { "type" : "literal", "value" : "yes" , "lang" : "en" } ] } ,
  "http://dbpedia.org/resource/Failure_of_electronic_components" : { "http://www.w3.org/2000/01/rdf-schema#seeAlso" : [ { "type" : "uri", "value" : "http://dbpedia.org/resource/Reliability_(semiconductor)" } ] ,
    "http://dbpedia.org/ontology/wikiPageWikiLink" : [ { "type" : "uri", "value" : "http://dbpedia.org/resource/Reliability_(semiconductor)" } ] } ,
  "http://dbpedia.org/resource/Reliability" : { "http://dbpedia.org/ontology/wikiPageWikiLink" : [ { "type" : "uri", "value" : "http://dbpedia.org/resource/Reliability_(semiconductor)" } ] ,
    "http://dbpedia.org/ontology/wikiPageDisambiguates" : [ { "type" : "uri", "value" : "http://dbpedia.org/resource/Reliability_(semiconductor)" } ] } ,
  "http://dbpedia.org/resource/Sherlock_Automated_Design_Analysis" : { "http://dbpedia.org/ontology/wikiPageWikiLink" : [ { "type" : "uri", "value" : "http://dbpedia.org/resource/Reliability_(semiconductor)" } ] } ,
  "http://dbpedia.org/resource/Integrated_circuit_design" : { "http://dbpedia.org/ontology/wikiPageWikiLink" : [ { "type" : "uri", "value" : "http://dbpedia.org/resource/Reliability_(semiconductor)" } ] } ,
  "http://dbpedia.org/resource/Transistor_aging" : { "http://dbpedia.org/ontology/wikiPageWikiLink" : [ { "type" : "uri", "value" : "http://dbpedia.org/resource/Reliability_(semiconductor)" } ] } ,
  "http://dbpedia.org/resource/Luca_Selmi" : { "http://dbpedia.org/ontology/wikiPageWikiLink" : [ { "type" : "uri", "value" : "http://dbpedia.org/resource/Reliability_(semiconductor)" } ] } ,
  "http://dbpedia.org/resource/Tibor_Grasser" : { "http://dbpedia.org/ontology/wikiPageWikiLink" : [ { "type" : "uri", "value" : "http://dbpedia.org/resource/Reliability_(semiconductor)" } ] }
}